L67 - L69 |
Determining the Wafer Temperature in Atmospheric Thermal Silicon Oxidation Reactors Philipossian A, Soleimani HR |
L69 - L71 |
Si Oxyhydrides on Stain-Etched Porous Si Thin-Films and Correlation with Crystallinity and Photoluminescence Steckl AJ, Xu J, Mogul HC, Prokes SM |
L72 - L73 |
Electrocatalytic Oxidation of Methane to C-2 Hydrocarbons Using an Li+ Ion Conductor Hibino T, Masegi A, Iwahara H |
L74 - L75 |
Laser-Microwave Photoconductivity of Thermally Oxidized Silicon-Wafers - Laser Wavelength and Power Dependence Khong YL |
L76 - L78 |
In-Situ La, Ce, and Nd L-Edge X-Ray-Absorption Fine-Structure Study of an Intermetallic Metal Hydride Electrode in an Operating Alkaline Battery Tryk DA, Bae IT, Scherson D, Antonio MR, Jordan GW, Huston EL |
1359 - 1364 |
Supersaturated Zincate Solutions - A Structural Study Debiemmechouvy C, Vedel J, Bellissentfunel MC, Cortes R |
1365 - 1368 |
Computer-Simulation on the Usage Efficiency of Cathode Material in Alkaline Batteries Kamata M, Esaka T, Morimoto H |
1368 - 1376 |
Chemical and Electrochemical Parameters for Oxygen Reduction on Pt-H2Wo4/Carbon Electrodes in 99-Percent H3PO4 Essalik A, Savadogo O, Ajersch F |
1376 - 1383 |
Effects of pH and Anion on Hydrogen Sorption-Desorption at Within Oxide-Derived Pd Electrodes Hu CC, Wen TC |
1383 - 1389 |
Studies on Electrochemical Oxidation of Nonaqueous Electrolytes Using in-Situ FTIR Spectroscopy .1. The Effect of Type of Electrode on on-Set Potential for Electrochemical Oxidation of Propylene Carbonate Containing 1.0 Mol Dm(-3) Liclo4 Kanamura K, Toriyama S, Shiraishi S, Takehara Z |
1390 - 1395 |
In-Situ Raman and Electrochemical Characterization of the Role of Electrolyte Additives in Li/SOCl2 Batteries Kovac M, Milicev S, Kovac A, Pejovnik S |
1396 - 1401 |
Preparation of MgO Protective Layer for AC-Type Plasma Display Panel by Means of Screen-Printing Koiwa I, Kanehara T, Mita J |
1401 - 1408 |
Proton Diffusion in Nickel-Hydroxide Films - Measurement of the Diffusion-Coefficient as a Function of State of Charge Motupally S, Streinz CC, Weidner JW |
1409 - 1422 |
Role of Structural and Electronic-Properties of Pt and Pt Alloys on Electrocatalysis of Oxygen Reduction - An in-Situ XANES and EXAFS Investigation Mukerjee S, Srinivasan S, Soriaga MP, Mcbreen J |
1423 - 1430 |
Modeling of a Growing Oxide Film - The Iron Iron-Oxide System Battaglia V, Newman J |
1431 - 1435 |
Zero-Strain Insertion Material of Li(Li1/3Ti5/3)O-4 for Rechargeable Lithium Cells Ohzuku T, Ueda A, Yamamoto N |
1436 - 1441 |
Spectroelectrochemical Studies of Metallophthalocyanines Adsorbed on Electrode Surfaces Mho S, Ortiz B, Park SM, Ingersoll D, Doddapaneni N |
1442 - 1446 |
XPS Studies on (Peo)(N)Liclo4 and (Peo)(N)Cu(ClO4)(2) Polymer Electrolytes Martinvosshage D, Chowdari BV |
1447 - 1453 |
Corrosion Inhibition of Iron in Acid-Solutions by Biological Siderophores Mccafferty E, Mcardle JV |
1454 - 1458 |
Electrochemical Studies of the Influence of Beryllium on the Corrosion-Resistance of Ni-25Cr-1Omo Cast Alloys for Dental Applications Pan J, Geisgerstorfer J, Thierry D, Leygraf C |
1459 - 1468 |
Initial Interaction of Sulfur-Dioxide with Water Covered Metal-Surfaces - An in-Situ IRAS Study Persson D, Leygraf C |
1468 - 1477 |
Metal Carboxylate Formation During Indoor Atmospheric Corrosion of Cu, Zn, and Ni Persson D, Leygraf C |
1478 - 1483 |
Polyamino-Benzoquinone Polymers - A New Class of Corrosion-Inhibitors for Mild-Steel Muralidharan S, Phani KL, Pitchumani S, Ravichandran S, Iyer SV |
1484 - 1489 |
Sulfidation of Zinc by Traces of Hydrogen-Sulfide in Air Svensson JE, Johansson LG |
1490 - 1495 |
Mechanism of (111)Silicon Etching in HF-Acetonitrile Rieger MM, Kohl PA |
1495 - 1500 |
Empirical Modeling End Response Surfaces for Electroless Co Deposition Process Paunovic M, Nguyen T, Mukherjee R, Sambucetti C, Romankiw LT |
1501 - 1508 |
Anodized Niobium Electrodes Under Cathodic Polarization - Electrochemical and Optical Studies Vaskevich A, Rosenblum M, Gileadi E |
1509 - 1519 |
Mathematical-Modeling of a Nickel-Cadmium Cell - Proton Diffusion in the Nickel Electrode Devidts P, White RE |
1519 - 1524 |
Doped Prmno3 Perovskite Oxide as a New Cathode of Solid Oxide Fuel-Cells for Low-Temperature Operation Ishihara T, Kudo T, Matsuda H, Takita Y |
1525 - 1531 |
Electrocatalysis of Anodic Oxygen-Transfer Reactions - Aliphatic-Amines at Mixed Silver-Lead Oxide-Film Electrodes Ge JS, Johnson DC |
1531 - 1538 |
Effect of Surface Roughening on the Catalytic Activity of Pt-Cr Electrocatalysts for the Oxygen Reduction in Phosphoric-Acid Fuel-Cell Kim KT, Kim YG, Chung JS |
1539 - 1545 |
Solution-Modified N-GaAs/Aqueous Polyselenide Photoelectrochemistry Forouzan F, Licht S |
1546 - 1551 |
Speciation Analysis of Aqueous Polyselenide Solutions Licht S, Forouzan F |
1552 - 1559 |
Protonic Conduction Domain of Indium-Doped Calcium Zirconate Kurita N, Fukatsu N, Ito K, Ohashi T |
1559 - 1563 |
Oxide-Ion Conductivity in the Solid-Solutions - Ca1-Xnaxbi2Nb2O9-X/2 and Cabi2Nb2-Ytiyo9-Y/2 - The Relative Importance of A-Site Versus B-Site Substitution Pham AQ, Yazdi I, Jacobson AJ |
1563 - 1565 |
High-Speed Anisotropic Reactive Ion Etching of Gold-Films Aldridge FT |
1566 - 1572 |
Low-Pressure Chemical-Vapor-Deposition of Si1-xGex Films on SiO2 - Characterization and Modeling Cao M, Wang A, Saraswat KC |
1573 - 1578 |
Growth-Characteristics and Properties of Tin Coating by Chemical-Vapor-Deposition Cheng HE, Chiang MJ, Hon MH |
1579 - 1584 |
Low-Temperature Formation of Shallow P(+)N Junctions by Bf2+ Implantation into Thin Pd2Si Films on Si Substrates Lin CT, Ma KP, Chou PF, Cheng HC |
1585 - 1590 |
2-Dimensional Aluminum Diffusion in Silicon - Experimental Results and Simulations Galvagno G, Lavia F, Saggio MG, Lamantia A, Rimini E |
1590 - 1594 |
Spontaneous Polysilicon and Epitaxial Silicon Deposition Mieno F, Tukune A, Miyata H, Shimizu A, Furumura Y |
1595 - 1601 |
Oxidation of Porous Silicon Under Water-Vapor Environment Ogata Y, Niki H, Sakka T, Iwasaki M |
1601 - 1607 |
Selective Etching of B-Doped Silicon - Mechanisms and 2-Dimensional Delineation of Concentration Profiles Spinella C, Raineri V, Campisano SU |
1608 - 1614 |
Influence of Hydrogen Pressure on the Properties of CVD Tungsten Silicide Films Thomas N, Dutron AM, Vahlas C, Bernard C, Madar R |
1615 - 1618 |
The Role of Surface-Charge in Low-Voltage Electrophotography Willems WP, Welten PL, Marland FW, Vanswaaij RA |
1619 - 1625 |
The Influence of Medium Dose Ion-Implantation on the Reliability of Thin Gate Oxide Yoneda K, Hagiwara K, Todokoro Y |
1625 - 1629 |
Kinetic Modeling of Silane Surface-Reactions Zuo R, Narusawa U, Tangborn A, Nowak W |
1629 - 1633 |
Vacuum-Deposited Gold-Films .2. Role of the Crystallographic Orientation of Oxide-Covered Silicon Substrates Golan Y, Margulis L, Matlis S, Rubinstein I |
1634 - 1636 |
Nondestructive Measurement of Porous Silicon Thickness Using X-Ray Reflectivity Guilinger TR, Kelly MJ, Chason EH, Headley TJ, Howard AJ |
1637 - 1640 |
Photoluminescence of Mn2+-Doped Znga2O4 Single-Crystal Fibers Jia WY, Liu HM, Huang SH, Wu XK, Lu LZ, Yen WM |
1640 - 1643 |
Preparation of Paraelectric PLT Thin-Films Using Reactive Magnetron Sputtering of Multicomponent Metal Target Kim HH, Sohn KS, Casas LM, Pfeffer RL, Lareau RT |
1644 - 1647 |
Electrochromic Properties of Molybdenum Trioxide Thin-Films Prepared by Chemical-Vapor-Deposition Maruyama T, Kanagawa T |
1647 - 1651 |
On the Improper Use of Yang Preferential Etching in Determining Precipitate Densities in Crystalline Silicon Choe KS |
1651 - 1653 |
Exploratory Observations of Effect of Rapid Thermal-Processing on Silicon Minority-Carrier Lifetime Using Laser Microwave Photoconductance Method Choi WK, Ah LK, Chan YM, Ramam A |
1654 - 1658 |
Simulation of Phosphorus Diffusion in Silicon Using a Pair Diffusion-Model with a Reduced Number of Parameters Ghaderi K, Hobler G |
1659 - 1662 |
The Effects of Alkoxy Functional-Groups on Atmospheric-Pressure Chemical-Vapor-Deposition Using Alkoxysilane and Ozone Ikeda K, Nakayama S, Maeda M |
1663 - 1666 |
Microcrystalline Silicon Films Deposited by Cathode-Type RF Glow-Discharge Technique Jayatissa AH, Nakanishi Y, Hatanaka Y |
1667 - 1670 |
Interface Smoothing of High Indium Content InGaAs Layers on GaAs Kim SD, Lee H, Harris JS |
1670 - 1675 |
Atomic Layer Epitaxy Growth of Tantalum Oxide Thin-Films from Ta(Oc2H5)(5) and H2O Kukli K, Ritala M, Leskela M |
1675 - 1680 |
Plasma Damages of Thin Oxide Measured by a Large Charge Collecting Antenna Structure Macek M, Osredkar R, Ishengliu, Belic A, Kordesch AV |
1680 - 1688 |
Pitting of the Silicon Layer of Poly Buffered Locos Stack Obeng YS, Brady DC, Vitkavage SC, Taylor JA, Hanson KJ, Sapjeta BJ |
1688 - 1692 |
Application of Ultraviolet Diffuse-Reflectance in the Study of Silicide Films Saran M, Naem A |
1692 - 1698 |
Eliminating Metal-Sputter Contamination in Ion Implanter for Low-Temperature-Annealed, Low-Reverse-Bias-Current Junctions Tomita K, Migita T, Shimonishi S, Shibata T, Ohmi T, Nitta T |
1699 - 1701 |
Synchrotron Section Topographic Study of Czochralski-Grown Silicon-Wafers for Advanced Memory-Circuits Tuomi T, Tuominen M, Prieur E, Partanen J, Lahtinen J, Laakkonen J |
1702 - 1705 |
In Situ Growth and Characterization of La0.8Sr0.2Coo3 Perovskite Mixed Conductor Films Brosha EL, Chung BW, Garzon FH, Raistrick ID, Houlton RJ, Hawley ME |
1705 - 1712 |
In-Situ Characterization of Anodic Silicon-Oxide Films by AC-Impedance Measurements Schmuki P, Bohni H, Bardwell JA |
1712 - 1725 |
An Approach for Modeling Surface-Reaction Kinetics in Chemical-Vapor-Deposition Processes Wang YF, Pollard R |
1726 - 1731 |
Progress and Challenges in Bipolar Lead-Acid-Battery Development Bullock KR |
1732 - 1732 |
Reaction of 1,1,1,5,5,5-Hexafluoro-2,4-Pentanedione (H(+)Hfac) with CuO, Cu2O, and Cu Films (Vol 142, Pg 961, 1995) George MA, Hess DW, Beck SE, Ivankovits JC, Bohling DA, Lane AP |
1732 - 1732 |
An Oxynitride Isfet Modified for Working in a Differential-Mode for pH Detection (Vol 141, Pg 535, 1994) Rocher V, Chovelon JM, Joffrezicrenault N, Cros Y, Birot D |
1732 - 1732 |
Ionic-Conductivity in Ordered and Disordered Phases of Plastic Crystals (Vol 141, Pg 1921, 1994) Chandra D, Helms JH, Majumdar A |
1732 - 1732 |
Thermal Incorporation of External Oxygen into Emd-Derived Manganese Oxides (Vol 141, Pg 3343, 1994) Xu CN, Miyazaki K |