267 - 270 |
Dynamic Rate and Thickness Metrology During Poly-Si Rapid Thermal Chemical-Vapor-Deposition from SiH4 Using Real-Time in-Situ Mass-Spectrometry Tedder LL, Rubloff GW, Cohaghan BF, Parsons GN |
271 - 277 |
Optical-Temperature Measurement by Grating Expansion for Rotating Semiconductor Wafers Huang C, Lang M, Brueck SR |
278 - 285 |
Adsorption Induced Gas-Transport Phenomena in Narrow Air Channels Recorded with Work Function Detectors Flietner B, Doll T, Lechner J, Eisele I |
286 - 292 |
Irradiation-Induced Decomposition of Al2O3 During Auger-Electron Spectroscopy Analysis Park JW, Pedraza AJ, Allen WR |
293 - 298 |
Characterization of Low-Resistivity Indium Oxide-Films by Auger-Electron Spectroscopy, X-Ray Photoelectron-Spectroscopy, and X-Ray-Diffraction and Correlation Between Their Properties, Composition, and Texture Jeong JI, Moon JH, Hong JH, Kang JS, Fukuda Y, Lee YP |
299 - 305 |
X-Ray Photoelectron-Spectroscopy Studies of Alkoxide-Derived Lithium-Niobate Kaufherr N, Eichorst DJ, Payne DA |
306 - 311 |
Chemical-Vapor-Deposition of Aluminum and Gallium Nitride Thin-Films from Metalorganic Precursors Hoffman DM, Rangarajan SP, Athavale SD, Economou DJ, Liu JR, Zheng ZS, Chu WK |
312 - 318 |
Nucleation Behavior in Molecular-Beam and Chemical-Vapor-Deposition of Silicon on Si(111)-(7X7) Andersohn L, Berke T, Kohler U, Voigtlander B |
319 - 326 |
Enhanced Adherence of Area-Selective Electroless Metal Plating on Insulators Shafeev GA, Themlin JM, Bellard L, Marine W, Cros A |
327 - 331 |
Role of Chemical Bonding in the Epitaxial-Growth of Noble-Metals on Ionic-Crystal Substrates Yamamoto K, Kasukabe Y, Takeishi R, Osaka T |
332 - 335 |
Fabrication and Characterization of Extremely Smooth Large-Area Gold Surfaces Woodard NG, Lafyatis GP |
336 - 345 |
Pure and Fluorine-Doped Silica Films Deposited in a Hollow-Cathode Reactor for Integrated-Optic Applications Bazylenko MV, Gross M, Simonian A, Chu PL |
346 - 351 |
Development of 111 Texture in Al Films Grown on SiO2/Si(001) by Ultrahigh-Vacuum Primary-Ion Deposition Kim YW, Petrov I, Greene JE, Rossnagel SM |
352 - 358 |
Effects of Oblique Energetic Bombardment on the Morphology and Microstructure of Triode Ion-Plated Titanium Films Gunasekhar KR, Krishna MG, Raju AR, Krishna KN, Mohan S |
359 - 366 |
Chemical-Shifts and Optical-Properties of Tin Oxide-Films Grown by a Reactive Ion-Assisted Deposition Choi WK, Jung HJ, Koh SK |
367 - 369 |
New Method of Tubular Material Inner Surface Modification by Plasma Source Ion-Implantation Sun M, Yang SZ, Li B |
370 - 373 |
Ion Deposition by Inductively-Coupled Plasma-Mass Spectrometry Hu K, Houk RS |
374 - 379 |
Pulsed Plasma Deposition of Chromium-Oxide Chromium-Cermet Coatings Gall D, Gampp R, Lang HP, Oelhafen P |
380 - 383 |
Measurement of the Gas Temperature in Fluorocarbon Radio-Frequency Discharges Using Infrared-Absorption Spectroscopy Haverlag M, Stoffels E, Stoffels WW, Kroesen GM, Dehoog FJ |
384 - 390 |
Production and Destruction of Cfx Radicals in Radiofrequency Fluorocarbon Plasmas Haverlag M, Stoffels WW, Stoffels E, Kroesen GM, Dehoog FJ |
391 - 397 |
Measurements of Pulsed-Power Modulated Argon Plasmas in an Inductively-Coupled Plasma Source Ashida S, Shim MR, Lieberman MA |
398 - 403 |
Simulation of Microloading in Aluminum Etching Aoki M, Sasamura Y |
404 - 407 |
H2O Pumping by Sputter Discharge with a LaB6 Cathode Funato Y, Miyoshi M, Akaishi K, Kubota Y, Mushiaki M |
408 - 414 |
Extraction of Oxygen from CO2 Using Glow-Discharge and Permeation Techniques Wu D, Outlaw RA, Ash RL |
415 - 424 |
Mechanistic Studies of the Thermal-Decomposition of Metal-Carbonyls on Ni(100) Surfaces in Connection with Chemical-Vapor-Deposition Processes Xu MD, Zaera F |
425 - 430 |
Crystallographic Tilting in High-Misfit (100) Semiconductor Heteroepitaxial Systems Riesz F |
431 - 435 |
Characterization of Amorphous-Carbon Thin-Films Capano MA, Mcdevitt NT, Singh RK, Qian F |
436 - 440 |
Aging of Photochemical Vapor-Deposited Silicon-Oxide Thin-Films Parada EG, Gonzalez P, Pou J, Serra J, Fernandez D, Leon B, Perezamor M |
441 - 446 |
Strain-Measurements of Sigec Heteroepitaxial Layers on Si(001) Using Ion-Beam Analysis Sego S, Culbertson RJ, Smith DJ, Atzmon Z, Bair AE |
447 - 452 |
Healing of Surface-Defects in Hard Materials by Thin Coatings Konyashin IY |
453 - 461 |
Evaluation of the Dispersive Nature of Meshes Used for the Spherical-Aberration Correction of Electrostatic Lenses Kato M, Sekine T |
462 - 464 |
Effects of Surface Oxide on the Rapid Thermal Nitridation of Si(001) Copel M, Tromp RM, Timme HJ, Penner K, Nakao T |
465 - 470 |
Thermal-Stability of Silver in Ion-Exchanged Soda Lime Glasses Wang PW |
471 - 473 |
Plasma-Enhanced Chemical-Vapor-Deposition of Thick Silicon-Nitride Films with Low-Stress on InP Shi L, Steenbergen CA, Devreede AH, Smit MK, Scholtes TL, Groen FH, Pedersen JW |
474 - 477 |
Microwave Surfatron System for Plasma Processing Bardos L, Barankova H, Berg S |
478 - 480 |
Particle Formation in the Remote Plasma-Enhanced Chemical-Vapor-Deposition of Si Films from Si2H6-Sif4-H-2 Kim DH, Rhee SW |
481 - 484 |
Use of a Cu/Ag/Au Alloy as a Reference Material for the Calibration of X-Ray Photoelectron Spectrometers Strohmeier BR |
485 - 486 |
A Novel Tilt Assembly for Ultrahigh-Vacuum Xyz-Rotary Manipulators Labanda JG, Barnett SA |
489 - 489 |
Papers from the Dusty Plasmas - 95 Workshop on Generation, Transport, and Removal of Particles in Plasmas - Preface Carlile RN |
490 - 495 |
Plasma Crystal Morfill GE, Thomas H |
496 - 500 |
Wave-Propagation and Damping in Plasma Crystals Zuzic M, Thomas HM, Morfill GE |
501 - 505 |
Solid-Liquid Gaseous-Phase Transitions in Plasma Crystals Thomas HM, Morfill GE |
506 - 510 |
Coulomb Crystal-Formation from Growing Particles in a Plasma and the Analysis Hayashi Y, Tachibana K |
511 - 518 |
Particle Simulation of 2-Dimensional Dust Crystal-Formation in a Mesothermal Plasma-Flow Melandso F, Goree J |
519 - 524 |
Experimental Studies of 2-Dimensional and 3-Dimensional Structure in a Crystallized Dusty Plasma Pieper JB, Goree J, Quinn RA |
525 - 528 |
Diagnostic of Dusty Plasma Conditions by the Observation of Mach Cones Caused by Dust Acoustic-Waves Havnes O, Li F, Melandso F, Aslaksen T, Hartquist TW, Morfill GE, Nitter T, Tsytovich V |
529 - 534 |
Model for Ion-Induced Nucleation Based on Properties of Small Ionic Clusters Girshick SL, Rao NP, Kelkar M |
535 - 539 |
Anionic Clusters in Dusty Hydrocarbon and Silane Plasmas Hollenstein C, Schwarzenbach W, Howling AA, Courteille C, Dorier JL, Sansonnens L |
540 - 545 |
Growth-Processes of Particles in High-Frequency Silane Plasmas Watanabe Y, Shiratani M, Kawasaki H, Singh S, Fukuzawa T, Ueda Y, Ohkura H |
546 - 549 |
In-Situ Infrared-Absorption Spectroscopy of Dusty Plasmas Kroesen GM, Denboer JH, Boufendi L, Vivet F, Khouli M, Bouchoule A, Dehoog FJ |
550 - 555 |
Particle Formation Rates in Sulfur-Hexafluoride Plasma-Etching of Silicon Garrity MP, Peterson TW, Ohanlon JF |
556 - 561 |
Dust Formation and Charging in an Ar/SiH4 Radiofrequency Discharge Stoffels E, Stoffels WW, Kroesen GM, Dehoog FJ |
562 - 566 |
A Model for Transport and Agglomeration of Particles in Reactive Ion Etching Plasma Reactors Huang FY, Hwang HH, Kushner MJ |
567 - 571 |
Production of Nanometric Particles in Radio-Frequency Glow-Discharges in Mixtures of Silane and Methane Bertran E, Costa J, Viera G, Zhang RQ |
572 - 576 |
Electrical Characterization and Modeling of a Dust Forming Plasma in a Radio-Frequency Discharge Boufendi L, Bouchoule A, Hbid T |
577 - 581 |
Synthesis of Silicon-Nitride Particles in Pulsed Radio-Frequency Plasmas Buss RJ, Babu SV |
582 - 587 |
Particle-Beam Mass-Spectrometer Measurements of Particle Formation During Low-Pressure Chemical-Vapor-Deposition of Polysilicon and SiO2-Films Mcmurry PH, Nijhawan S, Rao N, Ziemann P, Kittelson DB, Campbell S |
588 - 594 |
Detection of Dust Particles in the Plasma by Laser-Induced Heating Stoffels WW, Stoffels E, Kroesen GM, Dehoog FJ |
595 - 602 |
In-Situ Characterization of the Transient-Behavior of Particles in Low-Pressure Plasmas Schmidt UI, Graves DB |
603 - 607 |
In-Situ Polarization-Sensitive Laser-Light-Scattering Method for Simultaneous Measurements of 2-Dimensional Spatial Size and Density Distributions of Particles in Plasmas Shiratani M, Kawasaki H, Fukuzawa T, Watanabe Y |
608 - 614 |
Dynamic Laser-Light Scattering Studies of Dusty Plasmas in the Gaseous-Electronics-Conference-Reference-Cell Anderson HM, Radovanov SB |
615 - 618 |
Production and Control of K-C-60 Plasma for Material Processing Hirata T, Hatakeyama R, Mieno T, Sato N |
619 - 623 |
The Dust Direct-Current Self-Bias Potential in a Time-Varying Plasma Sheath Melandso F, Nitter T, Aslaksen T, Havnes O |
624 - 630 |
Stochastic Charge Fluctuations in Dusty Plasmas Matsoukas T, Russell M, Smith M |
631 - 633 |
Ion-Dust Streaming Instability in Processing Plasmas Rosenberg M |
634 - 638 |
Particle Trapping, Transport, and Charge in Capacitively and Inductively-Coupled Argon Plasmas in a Gaseous-Electronics-Conference-Reference-Cell Collins SM, Brown DA, Ohanlon JF, Carlile RN |
639 - 643 |
Mapping of Radio-Frequency Plasma Potential Throughout a Particle Trapping Region Using an Emissive Probe Kang JW, Carlile RN, Ohanlon JF, Collins SM |
644 - 648 |
Cooling by Dust in Levitation Experiments and Its Effect on Dust Cloud Equilibrium Profiles Brattli A, Havnes O |
649 - 654 |
Particle Contamination Characterization in a Helicon Plasma-Etching Tool Selwyn GS, Bailey AD |
655 - 659 |
Experimental-Evidence for Nanoparticle Deposition in Continuous Argon-Silane Plasmas - Effects of Silicon Nanoparticles on Film Properties Cabarrocas PR, Gay P, Hadjadj A |
660 - 665 |
Massively-Parallel Simulations of Brownian Dynamics Particle-Transport in Low-Pressure Parallel-Plate Reactors Choi SJ, Rader DJ, Geller AS |