Thin Solid Films

Thin Solid Films, Vol.571 Entire volume, number list

ISSN: 0040-6090 (Print)

In this Issue (132 articles)

1 - 8	Microstructure, electrical resistivity and stresses in sputter deposited W and Mo films and the influence of the interface on bilayer properties Rane GK, Menzel S, Gemming T, Eckert J
9 - 12	Flexible n-i-p thin filmsilicon solar cells on polyimide foils with textured ZnO:Ga back reflector Marins E, Warzecha M, Micharda S, Hotovy J, Bottler W, Alpuim P, Finger F
13 - 17	Deposition and characterization of Pt nanocluster films by means of gas aggregation cluster source Kylian O, Prokes J, Polonskyi O, Cechvala J, Kousal J, Pesicka J, Hanus J, Biederman H
18 - 22	Stress transition from compressive to tensile for silicon nanocrystals embedded in amorphous silica matrix Zatryb G, Misiewicz J, Wilson PRJ, Wojcik J, Mascher P, Podhorodecki A
23 - 31	Influence of Ti top electrode thickness on the resistive switching properties of forming free and self-rectified TiO2 (-) (x) thin films Bousoulas P, Michelakaki I, Tsoukalas D
32 - 38	Three modes of inkless micro-contact printing: contact printing, edge spreading, and channel stamping Kim JH, Khang DY
39 - 44	Distinguishing mechanisms of morphological instabilities in phase change materials during switching Santala MK, Raoux S, Topuria T, Reed BW, LaGrange T, Campbell GH
45 - 50	Large Verdet constant in the Tb implanted gamma-Fe2O3 films Lv PW, Wang X, Huang F, Lin Z
51 - 55	Optical characterization of nanocrystalline boron nitride thin films grown by atomic layer deposition Snure M, Paduano Q, Hamilton M, Shoaf J, Mann JM
56 - 61	Effect of spatial inhomogeneity of charge carrier mobility on current-voltage characteristics in organic field-effect transistors Sworakowski J, Bielecka U, Lutsyk P, Janus K
62 - 68	Thickness dependent magnetic properties of (111)-oriented Co0.8Fe2.2O4 thin film grown by pulsed laser deposition Khodaei M, Ebrahimi SAS, Park YJ, Choi SH, Kim C, Son J, Baik S
69 - 74	Antibacterial-active multilayer films composed of polyoxometalate and Methyl Violet: Fabrication, characterization and properties Yu X, Chen CY, Peng J, Shi ZY, Shen Y, Mei JL, Ren ZX
75 - 83	The effect of process parameters on the structure, photocatalytic and self-cleaning properties of TiO2 and Ag-TiO2 coatings deposited using reactive magnetron sputtering Navabpour P, Ostovarpour S, Hampshire J, Kelly P, Verran J, Cooke K
84 - 89	Tin nitride thin films fabricated by reactive radio frequency magnetron sputtering at various nitrogen gas ratios Choi S, Kang J, Park J, Kang YC
90 - 93	Preparation of thin films of perovskite-type YAlO3:Gd3+-Pr3+ UV phosphors Shimizu Y, Ueda K, Massuyeau F, Jobic S
94 - 101	Evaluation of niobium dimethylamino-ethoxide for chemical vapour deposition of niobium oxide thin films Dabirian A, Kuzminykh Y, Wagner E, Benvenuti G, Rushworth S, Hoffmann P
102 - 107	Impact of capillarity forces on the steady-state self-organization in the thin chromium film on glass under laser irradiation Gedvilas M, Voisiat B, Regelskis K, Raciukaitis G
108 - 113	Ge surface-energy-driven secondary grain growth via two-step annealing Lee S, Son YH, Park Y, Hwang K, Shin YG, Yoon E
114 - 120	Morphological differences in transparent conductive indium-doped zinc oxide thin films deposited by ultrasonic spray pyrolysis Jongthammanurak S, Cheawkul T, Witana M
121 - 126	Crystallization kinetics of Se-Te thin films Svoboda R, Gutwirth J, Malek J, Wagner T
127 - 133	Layer-by-layer assembled TiO2 films with high ultraviolet light-shielding property Li XZ, Wang L, Pei YX, Jiang JQ
134 - 138	Effect of thermal annealing on the performance of WO3-Ag-WO3 transparent conductive film Lin BN, Lan CY, Li C, Chen ZX
139 - 144	Rapid and highly efficient growth of graphene on copper by chemical vapor deposition of ethanol Lisi N, Buonocore F, Dikonimos T, Leoni E, Faggio G, Messina G, Morandi V, Ortolani L, Capasso A
145 - 153	Effects of atomic ordering on the elastic properties of TiN- and VN-based ternary alloys Edstrom D, Sangiovanni DG, Hultman L, Chirita V
154 - 160	Surface structure optimization for cost effective field emission of zinc oxide nanorods on glass substrate Nayeri FD, Narimani K, Kolahdouz M, Asl-Soleimani E, Salehi F
161 - 167	Spectroelectrochemical andmorphological studies of the ageing of silver nanoparticles embedded in ultra-thin perfluorinated sputter deposited films Ebbert C, Alissawi N, Somsen C, Eggeler G, Strunskus T, Faupel F, Grundmeier G
168 - 174	Nanostructuration and band gap emission enhancement of ZnO film via electrochemical anodization Achour A, Soussou MA, Aissa KA, Islam M, Barreau N, Faulques E, Le Brizoual L, Djouadi MA, Boujtita M
175 - 179	Electron-beam induced surface relief shape inversion in amorphous Ge4As4Se92 thin films Bilanych V, Komanicky V, Feher A, Kuzma V, Rizak V
180 - 186	Pulsed laser deposition of La0.6Ca0.4Fe0.8Ni0.2O3 (- delta) thin films on SrTiO3: Preparation, characterization and electrical properties Sohrabi P, Daneshmandi S, Salamati H, Ranjbar M
187 - 193	A taper angle control technique using thin-film layer stiction phenomenon Kim Y, Heo E, Lee H
194 - 197	Al-Ni-Y-X (X = Cu, Ta, Zr) metallic glass composite thin films for broad-band uniform reflectivity Chang CM, Wang CH, Hsu JH, Huang JC
198 - 205	Improving the uncommon (110) growing orientation of Al-doped ZnO thin films through sequential pulsed laser deposition Coman T, Ursu EL, Nica V, Tiron V, Olaru M, Cotofana C, Dobromir M, Coroaba A, Dragos OG, Lupu N, Caltun OF, Ursu C
206 - 211	Hydrogen, oxygen and hydroxyl on porous silicon surface: A joint density-functional perturbation theory and infrared spectroscopy approach Alfaro P, Palavicini A, Wang CM
212 - 217	Roll-to-roll compatible organic thin film transistor manufacturing technique by printing, lamination, and laser ablation Hassinen T, Ruotsalainen T, Laakso P, Penttila R, Sandberg HGO
218 - 224	Comparative study of the radio-frequency magnetron sputter deposited CaP films fabricated onto acid-etched or pulsed electron beam-treated titanium Surmeneva MA, Surmenev RA, Tyurin AI, Mukhametkaliyev TM, Teresov AD, Koval NN, Pirozhkova TS, Shuvarin IA, Oehr C
225 - 229	Fabrication and characterization of pedestal optical waveguides using TeO2-WO3-Bi2O3 thin film as core layer Camilo ME, Kassab LRP, Assumpcao TAA, Cacho VDD, Alayo MI
230 - 237	Spectroscopic ellipsometry characterization of nano-crystalline diamond films prepared at various substrate temperatures and pulsed plasma frequencies using microwave plasma enhanced chemical vapor deposition apparatus with linear antenna delivery Mistrik J, Janicek P, Taylor A, Fendrych F, Fekete L, Jager A, Nesladek M
238 - 244	Variation of the nanostructural feature of nc-SiC:H thin films with post-deposition thermal annealing Sen CD, Son JI, Kim HH, Yun HS, Cho NH
245 - 246	Mechanical behavior of nanoscale multilayers Preface Molina-Aldareguia JM, Martin-Bragado I, Llorca J
247 - 252	Elevated temperature dependence of hardness in tri-metallic nano-scale metallic multilayer systems Schoeppner RL, Abdolrahim N, Salehinia I, Zbib HM, Bahr DF
253 - 259	Strain rate sensitivity and related plastic deformation mechanism transition in nanoscale Ag/W multilayers Zhou Q, Wang F, Huang P, Xu KW
260 - 267	Effect of layer thickness on the high temperature mechanical properties of Al/SiC nanolaminates Lotfian S, Mayer C, Chawla N, Llorca J, Misra A, Baldwin JK, Molina-Aldareguia JM
268 - 274	Thermal stability of nanoscale metallic multilayers Ramos AS, Cavaleiro AJ, Vieira MT, Morgiel J, Safran G
275 - 282	Microstructure and mechanical properties of physical vapor deposited Cu/W nanoscale multilayers: Influence of layer thickness and temperature Monclus MA, Karlik M, Callisti M, Frutos E, LLorca J, Polcar T, Molina-Aldareguia JM
283 - 289	Role of interface curvature on stress distribution under indentation for ZrN/Zr multilayer coating Verma N, Jayaram V
290 - 295	Size effects in the mechanical response of nanoscale multilayer coatings on glass Bull SJ
296 - 301	Assessment of mechanical properties of metallic thin-films through micro-beam testing Trueba M, Gonzalez D, Elizalde MR, Martinez-Esnaola JM, Hernandez MT, Li H, Pantuso D, Ocana I
302 - 307	Ductile film delamination from compliant substrates using hard overlayers Cordill MJ, Marx VM, Kirchlechner C
308 - 315	Contact damage and fracture micromechanisms of multilayered TiN/CrN coatings at micro- and nano-length scales Roa JJ, Jimenez-Pique E, Martinez R, Ramirez G, Tarrago JM, Rodriguez R, Llanes L
316 - 320	Influence of the IR-mirror layer composition in the mechanical properties of solar selective coatings made from Mo:Si3N4 cermet Alvarez-Fraga L, Monclus MA, Molina-Aldareguia JM, Sanchez-Garcia JA, Cespedes E, Escobar-Galindo R, Prieto C
321 - 324	Fabrication of customizable wedged multilayer Laue lenses by adding a stress layer Niese S, Kruger P, Kubec A, Laas R, Gawlitza P, Melzer K, Braun S, Zschech E
325 - 331	Electrochemical deposition of Cu and Nb from pyrrolidinium based ionic liquid Mascia M, Vacca A, Mais L, Palmas S, Musu E, Delogu F
333 - 333	ICSE VI Preface Otani Y, Tazawa M, Kawabata S
334 - 344	Spectroscopic ellipsometry - Past, present, and future Aspnes DE
345 - 355	On-line monitoring of solar cell module production by ellipsometry technique Fried M
356 - 363	On the development of Finite-Difference Time-Domain for modeling the spectroscopic ellipsometry response of 1D periodic structures Foo YS, Cheung KT, To CH, Zapien JA
364 - 370	Characterization of highly anisotropic three-dimensionally nanostructured surfaces Schmidt D
371 - 376	On the complex refractive index of polymer:fullerene photovoltaic blends Campoy-Quiles M, Muller C, Garriga M, Wang E, Inganas O, Alonso MI
377 - 383	Optical and magneto-optical characterization of thin films of functionalized tetraphenylporphyrins Lungwitz F, Mende C, Fronk M, Haidu F, Lang H, Salvan G, Zahn DRT
384 - 388	Free-charge carrier parameters of n-type, p-type and compensated InN:Mg determined by infrared spectroscopic ellipsometry Schooche S, Hofmann T, Darakchieva V, Wang X, Yoshikawa A, Wang K, Araki T, Nanishi Y, Schubert M
389 - 394	How spectroscopic ellipsometry can aid graphene technology? Losurdo M, Giangregorio MM, Bianco GV, Capezzuto P, Bruno G
395 - 398	Confinement in single walled carbon nanotubes investigated by spectroscopic ellipsometry Battie Y, Jamon D, Lauret JS, Gu Q, Gicquel-Guezo M, Naciri AE, Loiseau A
399 - 404	In and out of incidence plane Mueller matrix scattering ellipsometry of rough mc-Si Maria J, Aas LMS, Kildemo M
405 - 409	Importance of Mueller matrix characterization of bianisotropic metamaterials Guth N, Varault S, Grand J, Guida G, Bonod N, Gallas B, Rivory J
410 - 415	Polarizing properties and structural characteristics of the cuticle of the scarab Beetle Chrysina gloriosa del Rio LF, Arwin H, Jarrendahl K
416 - 419	Temperature dependence of the optical properties of Ba0.75Sr0.25TiO3 thin films Zelezny V, Chvostova D, Pajasova L, Jelinek M, Kocourek T, Danis S, Valvoda V
420 - 425	The dielectric tensor of monoclinic alpha-3,4,9,10-perylene tetracarboxylic dianhydride in the visible spectral range Alonso MI, Garriga M, Osso JO, Schreiber F, Scholz R
426 - 430	In situ ellipsometry - A powerful tool for monitoring alkali doping of organic thin films Haidu F, Ludemann M, Schafer P, Gordan OD, Zahn DRT
431 - 436	Optical diffractometry of anisotropic holographic structure composed of liquid crystal and polymer phases with extended Bragg modes Kakiuchida H, Tazawa M, Yoshimura K, Ogiwara A
437 - 441	An extended Drude model for the in-situ spectroscopic ellipsometry analysis of ZnO thin layers and surface modifications Fricke L, Bontgen T, Lorbeer J, Bundesmann C, Schmidt-Grund R, Grundmann M
442 - 446	Real time spectroscopic ellipsometry for analysis and control of thin film polycrystalline semiconductor deposition in photovoltaics Koirala P, Attygalle D, Aryal P, Pradhan P, Chen J, Marsillac S, Ferlauto AS, Podraza NJ, Collins R
447 - 452	Optical Mueller matrix modeling of chiral AlxIn1 (-) N-x nanospirals Magnusson R, Birch J, Sandstrom P, Hsiao CL, Arwin H, Jarrendahl K
453 - 462	Joint detection of tumor markers with imaging ellipsometry biosensor Niu Y, Kang TF, Jin G
463 - 467	Visualization of the interaction between tris and lysozyme with a biosensor based on total internal reflection imaging ellipsometry Kang TF, Niu Y, Jin G
468 - 472	In vitro characterization of optical property of mouse myoblast cells by spectroscopic ellipsometry Yang SM, Choi SJ, Kim HS, Kim SY
473 - 477	A sensitive bithiophene-based biosensor for interferon-gamma characterization and analysis Tsai PI, Lee SS, Chou ST, Jan CM, Chang YT, Lee ASY, Lee CK
478 - 483	Surface plasmon resonance combined with spectroscopic ellipsometry read-out for probing surface-biomolecule interaction Giangregorio MM, Bianco GV, Capezzuto P, Bruno G, Losurdo M
484 - 489	Compositional dependence of the optical conductivity of Ni1-xPtx alloys (0 < x < 0.25) determined by spectroscopic ellipsometry Abdallah LS, Zollner S, Lavoie C, Ozcan A, Raymond M
490 - 495	Utilization of the sum rule for construction of advanced dispersion model of crystalline silicon containing interstitial oxygen Franta D, Necas D, Zajickova L, Ohlidal I
496 - 501	Broadening of dielectric response and sum rule conservation Franta D, Necas D, Zajickova L, Ohlidal I
502 - 505	Temperature dependent dielectric function and reflectivity spectra of nonpolar wurtzite AlN Feneberg M, Romero MF, Neuschl B, Thonke K, Roppischer M, Cobet C, Esser N, Bickermann M, Goldhahn R
506 - 508	Combined direct- and reciprocal-space approach for converting spectra to energy scales with negligible loss of information Aspnes DE, Choi SG
509 - 512	Design of a real-time spectroscopic rotating compensator ellipsometer without systematic errors Broch L, Stein N, Zimmer A, Battie Y, Naciri AE
513 - 516	Development of a compact polarization analysis apparatus for plasma soft X-ray laser Imazono T, Koike M
517 - 521	Vacuum ultraviolet ellipsometer using inclined detector as analyzer to measure stokes parameters and optical constants - With results for AlN optical constants Saito T, Ozaki K, Fukui K, Iwai H, Yamamoto K, Miyake H, Hiramatsu K
522 - 526	Design, optimization and realization of a ferroelectric liquid crystal based Mueller matrix ellipsometer using a genetic algorithm Aas LMS, Skare DG, Ellingsen PG, Letnes PA, Kildemo M
527 - 531	Polarization modulation polarimeter for measuring two-dimensional distribution of five cell parameters of a twisted nematic liquid crystal display Chang YH, Yu CJ, Hsu KC, Ho CW, Chang SY, Chou C
532 - 537	In situ imaging ellipsometer using a LiNbO3 electrooptic crystal Jin LH, Wakako Y, Takizawa K, Kondoh E
538 - 542	Combining surface X-ray scattering and ellipsometry for non-destructive characterization of ion beam-induced GaSb surface nanostructures Hoydalsvik K, Aas LMS, Doli E, Sondergard E, Kildemo M, Breiby DW
543 - 547	A liquid crystal variable retarder-based reflectance difference spectrometer for fast, high precision spectroscopic measurements Hu CG, Xie PF, Huo SC, Li YN, Hu XT
548 - 553	Approach for extracting complex dielectric function spectra in weakly-absorbing regions Gautam LK, Haneef H, Junda MM, Saint John DB, Podraza NJ
554 - 557	The effects of Mn doping on the optical properties of chemically deposited BiFeO3 thin films Yan N, Zhang YL, Tang WL, Yang SH, Chen DH
558 - 561	Optical properties of epitaxial (Ba0.39Sr0.61)(6)Ti2Nb8O30 thin films grown by pulsed laser deposition Zhang YL, Yang SH, Teng DD
562 - 566	Depolarization correction method for ellipsometric measurements of large grain size zinc-oxide films Papa Z, Budai J, Hanyecz I, Csontos J, Toth Z
567 - 572	Characterization of in-depth cavity distribution after thermal annealing of helium-implanted silicon and gallium nitride Fodor B, Cayrel F, Agocs E, Alquier D, Fried M, Petrik P
573 - 578	Assessment of non-uniform thin films using spectroscopic ellipsometry and imaging spectroscopic reflectometry Necas D, Ohlidal I, Franta D, Cudek V, Ohlidal M, Vodak J, Sladkova L, Zajickova L, Elias M, Vizd'a F
579 - 583	Resolving lateral and vertical structures by ellipsometry using wavelength range scan Petrik P, Agocs E, Volk J, Lukacs I, Fodor B, Kozma P, Lohner T, Oh S, Wakayama Y, Nagata T, Fried M
584 - 588	Useful Mueller matrix symmetries for ellipsometry Arteaga O
589 - 592	Dielectric function spectra and inter-band optical transitions in TlGaS2 Kawabata T, Shim Y, Wakita K, Mamedov N
593 - 596	Dielectric function of zinc oxide thin films in a broad spectral range Mammadov E, Naghavi N, Jehl Z, Renou G, Tiwald T, Mamedov N, Lincot D, Guillemoles JF
597 - 600	Spectroscopic ellipsometry analysis of perovskite manganite films for resistance switching devices Yamada M, Sakai O, Nakamura T
601 - 604	Optical characterization of patterned thin films Rosu D, Petrik P, Rattmann G, Schellenberger M, Beck U, Hertwig A
605 - 608	Spectroscopic ellipsometry studies of sol-gel-derived Cu-doped ZnO thin films Yang SH, Zhang YL, Mo D
609 - 614	Optical metrology of thick photoresist process for advanced 3D applications Nolot E, Andre A, Scibetta C, Poulingue M, Levin L, Vignoud L, Issele H
615 - 619	Optical characterization by variable angle spectroscopic ellipsometry of nitrogen-doped MgxZn1-xO thin films prepared by the plasma-assisted reactive evaporation method Abe T, Nakagawa A, Nakagawa M, Chiba T, Takahashi S, Kashiwaba Y, Chiba S, Ojima T, Aota K, Daibo M, Osada H, Fujiwara T, Niikura I, Kashiwaba Y, Tsutsumi K, Suzuki M
620 - 624	Vibrational properties of bulk LaAlO3 from Fourier-transform infrared ellipsometry Willett-Gies T, DeLong E, Zollner S
625 - 630	Ellipsometry of monolayers of metallic nanoparticles taking into account depolarization Bortchagovsky EG, Mishakova TO, Hingerl K
631 - 636	Ellipsometric analysis of silicon surfaces textured by ns and sub-ps KrF laser pulses Toth Z, Hanyecz I, Gardian A, Budai J, Csontos J, Papa Z, Fule M
637 - 643	Dynamic analysis of DNA nanoparticle immobilization to model biomaterial substrates using combinatorial spectroscopic ellipsometry and quartz crystal microbalance with dissipation Kasputis T, Pieper A, Schubert M, Pannier AK
644 - 647	Optical properties of hydrated tungsten trioxide 3WO(3)center dot H2O Valyukh I, Jiao Z, Arwin H, Sun XW
648 - 652	Infrared ellipsometry for improved laterally resolved analysis of thin films Hinrichs K, Furchner A, Sun GG, Gensch M, Rappich J, Oates TWH
653 - 659	Formulation of error propagation and estimation in grating reconstruction by a dual-rotating compensator Mueller matrix polarimeter Chen XG, Liu SY, Gu HG, Zhang CW
660 - 665	Symmetries and relationships between elements of the Mueller matrix spectra of the cuticle of the beetle Cotinis mutabilis Munoz-Pineda E, Jarrendahl K, Arwin H, Mendoza-Galvan A
666 - 668	Surface roughness and optical contact characterization of transparent prisms using frustrated total internal reflection tunneling ellipsometry Azzam RMA
669 - 674	On the modeling of ellipsometry data at large angles of incidence using finite-difference time-domain Foo Y, Cheung KT, To CH, Zapien JA
675 - 679	Optical properties of nitrogen-doped graphene thin films probed by spectroscopic ellipsometry Shen CC, Tseng CC, Lin CT, Li LJ, Liu HL
680 - 683	Temperature dependence of the electronic gaps of semiconductors Cardona M, Kremer RK
684 - 688	Approaches to calculate the dielectric function of ZnO around the band gap Agocs E, Fodor B, Pollakowski B, Beckhoff B, Nutsch A, Jank M, Petrik P
689 - 694	Infrared to vacuum-ultraviolet ellipsometry studies of spinel (MgAl2O4) Zollner CJ, Willett-Gies TI, Zollner S, Choi S
695 - 700	Improved combination of scalar diffraction theory and Rayleigh-Rice theory and its application to spectroscopic ellipsometry of randomly rough surfaces Ohlidal I, Franta D, Necas D
701 - 705	Transmission ellipsometry of anisotropic substrates and thin films at oblique incidence. Handling multiple reflections Arteaga O, Freudenthal J, Nichols S, Canillas A, Kahr B
706 - 711	Optical properties of CuCdTeO thin films sputtered from CdTe-CuO composite targets Mendoza-Galvan A, Arreola-Jardon G, Karlsson LH, Persson POA, Jimenez-Sandoval S
712 - 714	Optical indices of switchable mirrors based on Mg-Y alloy thin films in the transparent state Yamada Y, Miura M, Tajima K, Okada M, Tazawa M, Yoshimura K
715 - 719	Spectroellipsometric and ion beam analytical studies on a glazed ceramic object with metallic lustre decoration Lohner T, Agocs E, Petrik P, Zolnai Z, Szilagyi E, Kovacs I, Szokefalvi-Nagy Z, Toth L, Toth AL, Illes L, Barsony I
720 - 726	Study of annealing effects upon the optical and electrical properties of SnO2:F/SiCxOy low emissivity coatings by spectroscopic ellipsometry Wang KK, Cheng B, Wu B, Defranoux C, Basa P, Song CL, Han GR, Liu Y
727 - 734	ZnO based transparent conductive oxide films with controlled type of conduction Zaharescu M, Mihaiu S, Toader A, Atkinson I, Calderon-Moreno J, Anastasescu M, Nicolescu M, Duta M, Gartner M, Vojisavljevic K, Malic B, Ivanov VA, Zaretskaya EP
735 - 738	Ionic liquid structure at the electrified ionic liquid vertical bar Hg interface studied using in situ spectroscopic ellipsometry Nishi N, Uchiyashiki J, Oogami R, Sakka T
739 - 743	Comparison and analysis of Mueller-matrix spectra from exoskeletons of blue, green and red Cetonia aurata Arwin H, del Rio LF, Jarrendahl K
744 - 748	In situ study of ligand-receptor interaction by total internal reflection ellipsometry Balevicius Z, Baleviciute I, Tumenas S, Tamosaitis L, Stirke A, Makaraviciute A, Ramanaviciene A, Ramanavicius A
749 - 755	In-situ spectroscopic ellipsometry of microcrystalline silicon deposited by plasma-enhanced chemical vapor deposition on flexible Fe-Ni alloy substrate for photovoltaic applications Mrazkova Z, Torres-Rios A, Ruggeri R, Foldyna M, Postava K, Pistora J, i Cabarrocas PR
756 - 761	Characterization of mu c-Si:H/a-Si:H tandem solar cell structures by spectroscopic ellipsometry Murata D, Yuguchi T, Fujiwara H
762 - 766	Flash-lamp annealing of ZnO-layers on copper-indium-gallium-sulphide layers: A spectroscopic ellipsometry study Reck J, Seeger S, Weise M, Mientus R, Schulte J, Ellmer K