Thin Solid Films

Thin Solid Films, Vol.319, No.1-2 Entire volume, number list

ISSN: 0040-6090 (Print)

In this Issue (46 articles)

1 - 8	Strain analysis by X-ray diffraction Fewster PF, Andrew NL
9 - 15	Limits of validity of the crystallite group method in stress determination of thin film structures Gergaud P, Labat S, Thomas O
16 - 19	New X-ray diffraction method for materials science Swiatek Z, Bonarski JT, Ciach R, Kuznicki ZT
20 - 24	Combined high resolution X-ray diffraction and EXAFS studies of Si(1-x)Ge-x heterostructures De Padova P, Felici R, Larciprete R, Ferrari L, Ortega L, Formoso V, Comin F, Balerna A
25 - 28	HR XRD for the analysis of ultrathin centrosymmetric strained DB-RTD heterostructures Haase M, Prost W, Velling P, Liu Q, Tegude FJ
29 - 34	HRXRD study of compositional uniformity of MOVPE grown InGaAs Xu J, Cheng XJ
35 - 38	Fine interference effects in X-ray diffraction from multilayered structures Zolotoyabko E
39 - 43	Investigation of inhomogeneous structures of near-surface-layers in ion-implanted silicon Swiatek Z, Bonarski JT, Ciach R, Kuznicki ZT, Fodchuk IM, Raransky MD, Gorley P
44 - 48	Ion-assisted deposition of Ag(011)/Fe(001) multilayers: Interface roughness Gladyszewski G, Jaouen C, Declemy A, Girard JC, Guerin P
49 - 56	X-ray scattering study of quantum wires and lateral periodic heterostructures Tapfer L, De Caro L, Zhuang Y, Sciacovelli P, Sacchetti A
57 - 61	Study of structural properties of MOVPE grown ZnMgSSe layer by HRXRD and cathodoluminescence Xu J, Liu Q, Kalisch H, Woitok J, Heuken M, Lakner H
62 - 66	In-depth structural X-ray investigation of PECVD grown diamond films on titanium alloys Andreazza P, De Barros MI, Andreazza-Vignolle C, Rats D, Vandenbulcke L
67 - 72	Combined characterization of conductive materials by infrared spectroscopic ellipsometry and grazing X-ray reflectance Boher P, Luttmann M, Stehle JL, Hennet L
73 - 77	X-ray reflectivity of multilayer mirrors for the water window Grimmer H, Boni P, Breitmeier U, Clemens D, Horisberger M, Mertins HC, Schafers F
78 - 80	Structure characterization of metallic multilayers by symmetric and asymmetric X-ray diffraction Gladyszewski G, Labat S, Gergaud P, Thomas O
81 - 83	Morphological study of cobalt aggregates in magnetic multilayers by grazing-incidence small-angle X-ray scattering Naudon A, Babonneau D, Petroff F, Vaures A
84 - 86	Lattice parameter change in submicron Si whiskers Klimovskaya AI, Ostrovskii IP, Fadeyev SV, Fruginskii MS, Rudyi IO
87 - 91	Atomic and electronic structure of diamond grain boundaries analyzed by HRTEM and EELS Ichinose H, Nakanose M
92 - 96	Application of focused ion beam milling to cross-sectional TEM specimen preparation of industrial materials including heterointerfaces Kuroda K, Takahashi M, Kato T, Saka H, Tsuji S
97 - 100	EELS analysis of hydrogenated diamond-like carbon films Ponsonnet L, Donnet C, Varlot K, Martin JM, Grill A, Patel V
IX - IX	Papers presented at the 1997 ICAM/E-MRS spring conference, symposium C : Recent developments in electron microscopy and x-ray diffraction of thin film structures, Strasbourg, France, June 16-20, 1997 - Preface Rocher AM, Cullis AG, Kuroda K, Ranganathan S
101 - 105	TEM observation of structural differences between two types of Ni silicide Si thin films caused by FIB irradiation Tanaka M, Furuya K, Saito T
106 - 109	Transmission electron microscopy of thin-film transistors on glass substrates Tsujimoto K, Tsuji S, Kuroda K, Saka H
110 - 114	Surface observation of Mo nanocrystals deposited on Si(111) thin films by a newly developed ultrahigh vacuum field-emission transmission electron microscope Tanaka M, Furuya K, Takeguchi M, Honda T
115 - 119	Growth structure of nickel films on GaAs(001) by dc-biased plasma-sputter-deposition Yang JP, Makihara K, Nakai H, Hashimoto M, Barna A, Barna PB
120 - 123	TEM observations of nanometer thick cobalt deposits in alumina sandwiches Fettar F, Maurice JL, Petroff F, Schelp LF, Vaures A, Fert A
124 - 127	Stable and metastable phases in the vacuum arc deposited Co thin films Straumal BB, Gust W, Vershinin NF, Watanabe T, Igarashi Y, Zhao X
128 - 131	Electrode-width dependence of resistivity and structure of aluminum electrode thin film electron beam evaporated on lithium tantalate Noguchi K, Nakai H, Ohashi H, Hashimoto M
132 - 139	Cross-sectional TEM observation of multilayer structure of a galvannealed steel Kato T, Hong MH, Nunome K, Sasaki K, Kuroda K, Saka H
140 - 143	Nanocrystalline thin titanium films grown on potassium bromide single crystals Braisaz T, Ruterana P, Nouet G, Komninou P, Kehagias T, Karakostas T, Poulopoulos P, Aggelakeris M, Flevaris N, Serra A
144 - 147	Transmission electron microscopy investigation of the structural characteristics of amorphous tetrahedral carbon films Lioutas CB, Vouroutzis N, Logothetidis S, Lefakis H
148 - 152	HREM: ultimate performances Van Dyck D
153 - 156	The volume expansion of the {11(2)over-bar-0} planar defect in 2H-GaN/6H-SiC(0001)(Si) grown by MBE Vermaut P, Bere A, Ruterana P, Nouet G, Hairie A, Paumier E
157 - 162	Quantitative analysis of strain field in thin films from HRTEM micrographs Snoeck E, Warot B, Ardhuin H, Rocher A, Casanove MJ, Kilaas R, Hytch MJ
163 - 167	Microstructure imaging of the YBCO thin film MgO substrate interface: HRTEM and Fourier analysis of the Moire fringe pattern Auzary S, Pailloux F, Denanot MF, Gaboriaud RJ
168 - 171	HRTEM study of strained Si/Ge multilayers Romeo M, Uhlaq-Bouillet C, Deville JP, Werckmann J, Ehret G, Chelly R, Dentel D, Angot T, Bischoff JL
172 - 176	Studies of metamorphic III-V heterostructures by digital processing of HREM images Rocher A, Snoeck E
177 - 181	Optical and digital processing of HRTEM images of Si thin films deposited by RTCVD Pailloux F, Mathe EL, Garem H, Gaboriaud RJ, Monna R, Muller JC
182 - 186	Structural aspects of the interface in silicon-on-sapphire system Gartstein E, Lach S, Mogilyanski D
187 - 190	Determination of interfacial roughness and its correlation in sputtered CoZr/Cu multilayers Langer J, Mattheis R, Krausslich J, Senz S, Hesse D, Schuhrke T, Zweck J
191 - 196	Investigation of chemical ordering in MBE-grown CoxPt1-x films by X-ray diffraction and high-resolution transmission electron microscopy Maret M, Ulhaq-Bouillet C, Staiger W, Cadeville MC, Lefebvre S, Bessiere M
197 - 201	XRD and TEM study of heteroepitaxial growth of zirconia on magnesia single crystal Guinebretiere R, Soulestin B, Dauger A
202 - 206	Epitaxial growth of YBa2Cu3O7-x thin films on (111) SrTiO3 substrates Brecht E, Reiner J, Rodewald M, Linker G
207 - 210	Crystallisation of perovskite PZT films on MgO substrates Barucca G, De Benedittis A, Di Cristoforo A, Majni G, Mengucci P, Leccabue F, Watts BE
211 - 214	Microstructure and strain relaxation in YBa2Cu3O7 epitaxial thin films Maurice JL, Durand O, Drouet M, Contour JP
215 - 218	Structural properties of Bi2Sr2CaCu2O8+delta thin films on (110) oriented SrTiO3 substrates Brecht E, Traeholt C, Schneider R, Geerk J, Meyer O, Linker G