Thin Solid Films

Thin Solid Films, Vol.459, No.1-2 Entire volume, number list

ISSN: 0040-6090 (Print)

In this Issue (71 articles)

1 - 1	Thin solid films - Preface Hilgers H, Knoll W, Luth H
2 - 6	LPE growth and characterisation of GaInAsSb and GaAlAsSb quaternary layers on (100) GaSb substrates Piskorski M, Piotrowska A, Piotrowski TT, Golaszewska K, Papis E, Katcki J, Ratajczak J, Barcz A, Wawro A
7 - 12	Deposition of epitaxial silicon carbide films using high vacuum MOCVD method for MEMS applications Lim DC, Jee HG, Kim JW, Moon JS, Lee SB, Choi SS, Boo JH
13 - 16	Ion beam assisted MBE of GaN on epitaxial TiN films Gerlach JW, Hoche T, Frost FE, Rauschenbach B
17 - 22	Deposition and in-situ characterization of ultra-thin films Voborny S, Kolibal M, Mach J, Cechal J, Babor PB, Prusa S, Spousta J, Sikola T
23 - 27	Formation of iron-nitrides by irradiation of Fe-57/Si bilayers with N2+ ions Bibic N, Milinovic V, Dhar S, Lieb KP, Milosavljevic M, Siljegovic M, Perusko D, Schaaf P
28 - 31	The effect of built-in electric field on As diffusion in HgCdTe graded-band-gap epitaxial layers Vlasov AR, Sokolovskii BS, Monastyrskii LS, Bonchyk OY, Barcz A
32 - 36	The electronic properties of the interface between a thin conjugated oligomer film and SiO2/Si(111), studied by photoemission spectroscopies Papaefthimiou V, Siokou A, Kennou S
37 - 40	High quality SiGe electronic material grown by low energy plasma enhanced chemical vapour deposition Chrastina D, Isella G, Rossner B, Bollani M, Muller E, Hackbarth T, von Kanel H
41 - 47	Simulation and characterization on properties of AlN films for SOI application Song ZR, Yu YH, Zou SC, Zheng ZH, Shen DS, Luo EZ, Xie Z, Sundaravel B, Wong SP, Wilson IH
48 - 52	Thickness dependent aggregation of Fe-silicide islands on Si substrate Molnar G, Dozsa L, Peto G, Vertesy Z, Koos AA, Horvath ZE, Zsoldos E
53 - 57	Interaction between point defects, extended defects and impurities in the Si-SiO2 system during the process of its formation Kropman D, Karner T, Abru U, Ugaste U, Mellikov E
58 - 62	Electrical properties and microstructure of buried oxide (BOX) of SIMOX studied by Conducting Atomic Force Microscopy (C-AFM) Song ZR, Chen KW, Yu YH, Luo EZ, Shen DS
63 - 66	Spectroscopic ellipsometry chraracterization of the interfacial roughness in simox wafers Li WJ, Song ZR, Tao K, Cheng XH, Yang WW, Yu YH, Wang X, Zou SC, Shen DS
67 - 70	Scanning capacitance microscopy investigations of lnGaAs/InP quantum wells Douheret O, Maknys K, Anand S
71 - 75	Improvement in ferroelectric properties of Pt/PZT/Pt capacitors etched as a function of Ar/O-2 gas mixing ratio intoCl(2)/CF4 plasma Lim KT, Koo SM, Kim KT, Kim DP, Kim CI
76 - 81	The etching properties of SBT thin films in BCl3/Cl-2/Ar plasma Kim DP, Yeo JW, Kim CI
82 - 85	Atomic exchange and magnetic properties of Co/Ag/Pt(111) Tzeng CL, Su CW, Ho HY, Shern CS
86 - 89	Morphology of micro- and nanoparticles emitted by copper plants in Western Poland Konarski P, Cwil M, Iwanejko I, Mierzejewska A, Diduszko R
90 - 94	Manipulation of Si oxide and electrically conducting carbon films by scanning probe microscopy (SPM): nano-lithography and nano-machining Myhra S
95 - 99	A mechanistic approach to tip-induced nano-lithography of polymer surfaces Blach JA, Watson GS, Brown CL, Pham DK, Wright J, Nicolau DV, Myhra S
100 - 105	Large area smoothing of optical surfaces by low-energy ion beams Frost F, Fechner R, Ziberi B, Flamm D, Schindler A
106 - 110	Importance of ion beam parameters on self-organized pattern formation on semiconductor surfaces by ion beam erosion Ziberi B, Frost F, Tartz M, Neumann H, Rauschenbach B
111 - 114	Luminescence of two-dimensional ordered array of the ZnO quantum nanodots, obtained by means of the synthetic opal Gruzintsev A, Volkov V, Emelchenko GA, Karpov IA, Maslov WM, Michailov GM, Yakimov EE
115 - 117	Selective plasma etching of powder coatings Kunaver M, Mozetic M, Klanjsek-Gunde M
118 - 121	Surface modification for biomedical purposes utilizing dielectric barrier discharges at atmospheric pressure Gessner C, Bartels V, Betker T, Matucha U, Penache C, Klages CP
122 - 126	Etching properties of Al2O3 films in inductively coupled plasma Kim DP, Yeo JW, Kim CI
127 - 130	Etching characteristic and mechanism of BST thin films using inductively coupled Cl-2/Ar plasma with additive CF4 gas Kim GH, Kim KT, Kim DP, Kim CI
131 - 136	Etching properties of ZnS thin films in Cl-2/CF4/Ar plasma Kim DP, Kim CI, Kwon KH
137 - 140	Self-consistent modelling of plasma-solid interaction in electronegative plasmas Hrach R, Sedlak D, Vicher M, Simek J
141 - 144	The influence of diffusion of fluorine compounds for silicon lateral etching Verdonck P, Goodyear A, Braithwaite NS
145 - 148	Diamond-like carbon microoptics elements Mousinho AP, Mansano RD, Cirino GA, Verdonck P
149 - 151	Further studies of N doped a-SiC : H films deposited by PECVD and annealed by pulse electron beam Huran J, Hotovy I, Kobzev AP, Balalykin NI
152 - 155	Tribological behavior of duplex coating improved by ion implantation Kakas D, Skoric B, Rakita M
156 - 159	Growth structure and magnetic property of CoPt films on GaAs(001) d.c.-sputter deposition Nakajima H, Tanaka T, Hashimoto M, Shi J, Nakamura Y
160 - 164	Peculiarities of thin film deposition by means of reactive impulse plasma assisted chemical vapor deposition (RIPACVD) method Werbowy A, Olszyna A, Zdunek K, Sokolowska A, Szmidt J, Barcz A
165 - 168	Structure and magnetic behavior of CoPt films prepared on MgO(001) substrates by dc plasma biased sputtering Yamaguchi K, Zhao ZY, Chen CC, Hashimoto M, Shi J, Nakamura Y
169 - 173	Self-selection in size and structure in argon clusters formed on amorphous carbon Krainyukova NV, van de Waal BW
174 - 177	Electrical and morphological properties of composite films near the percolation threshold: models of composite structures Hrach R, Svec M, Novak S, Sedlak D
178 - 182	Modern refractory AlMo and AlMoSi coatings on steels with diffusion barrier Wendler B, Danielewski M, Dabek J, Rylski A, Filipek R
183 - 186	Films of chalcogenide glassy semiconductors: new phenomena and new applications Lyubin V, Klebanov A, Feigel A, Sfez B
187 - 190	Structure and magnetic properties of epitaxial ferrite film grown on MgO(001) by MBE Kado T
191 - 194	The Curie temperature dependence on preparation conditions for Gd thin Yamada Y, Okada M, Jin P, Tazawa M, Yoshimura K
195 - 199	Electrical behavior of silicon nitride sputtered thin films Vila M, Prieto C, Ramirez R
200 - 202	Perpendicular magnetic anisotropy of CoPt-TiO2 composite film with nano-fiber structure Chen CC, Sakurai R, Hashimoto M, Shi J, Nakamura Y
203 - 207	Bonding structure and hydrogen content in silicon nitride thin films deposited by the electron cyclotron resonance plasma method Martinez FL, Ruiz-Merino R, del Prado A, San Andres E, Martil I, Gonzalez-Diaz G, Jeynes C, Barradas NP, Wang L, Reehal HS
208 - 211	Structure and magnetic behavior of reactive sputter deposited nanocomposite FePt-TiN films Sakurai R, Yamamoto Y, Chen CC, Hashimoto M, Shi J, Nakamura Y, Nittono O
212 - 215	Structure and mechanical properties of pure titanium film deposited onto TiNi shape memory alloy substrate by magnetron DC sputtering Sonoda T, Watazu A, Zhu J, Shi W, Kato K, Asahina T
216 - 219	Medium range ordering of amorphous silicon-carbon alloys studied by GISAXS, optical spectroscopy and IBA Gracin D, Dubcek P, Zorc H, Juraic K
220 - 223	Non-stoichiometric silicon oxide deposited at low gaseous N2O/SiH4 ratios da Silva Zambom L, Lantin DG, Onoda E, Verdonck P
224 - 227	Nanocrystalline diamond-like carbon coatings produced on the Si3N4-TiC composites intended for the edges of cutting tools Olszyna A, Smolik J
228 - 232	The brittle-to-ductile transition of As-S (Se) films under the action of light Trunov ML, Bilanich VS
233 - 236	Electrochemical determination of corrosion protection ability of fullerene thin films treated by radiofrequency plasma Sittner E, Enders B, Ensinger W
237 - 240	Determination of porosity of thin protective films on iron base materials and modelling of their development during aqueous corrosion Lee YY, Enders B, Ensinger W
241 - 244	Thickness determination for SiO2 films on Si by X-ray reflectometry at the SiK edge Krumrey A, Hoffmann M, Ulm G, Hasche K, Thomsen-Schmidt P
245 - 248	Residual stress and thermal stress observation in thin copper films Hanabusa T, Kusaka K, Sakata O
249 - 253	Photoluminescence from photochemically etched highly resistive silicon Hadjersi T, Gabouze N, Yamamoto N, Sakamaki K, Takai H
254 - 257	Raman spectra and structure of thin Cu-C-60 films Dmytrenko OP, Kulish NR, Prylutskyy YI, Shpilevskiy EM, Belyi NM, Gubanov V, Hietschold M, Schulze S, Ulanski J, Wojciechowski R, Kozanecki M, Scharff P
258 - 261	Self-sustained magnetron co-sputtering of Cu and Ni Posadowski WM
262 - 266	Stimulated emission from ZnO-SiO2-Si thin film nanoresonators obtained by magnetron sputtering method Gruzintsev A, Volkov V, Barthou C, Benalloul R, Frigerio JM
267 - 270	Deposition and characterisation of Al-Cu-Fe thin films Cekada M, Panjan P, Juric D, Dolinsek J, Zalar A
271 - 275	Metal-assisted chemical etching in HF/Na2S2O8 OR HF/KMnO4 produces porous silicon Hadjersi T, Gabouze N, Kooij ES, Zinine A, Ababou A, Chergui W, Cheraga H, Belhousse S, Djeghri A
276 - 281	Solid state de-wetting observed for vapor deposited copper films on carbon substrates Schrank C, Eisenmenger-Sittner C, Neubauer E, Bangert H, Bergauer A
282 - 285	Comparative studies of the feed gas composition effects on the characteristics of DLC films deposited by magnetron sputtering Libardi J, Grigorov K, Massi M, Otani C, Ravagnani SP, Maciel HS, Guerino M, Ocampo JMJ
286 - 291	TiN thin films deposited by ion beam sputtering: effects of energetic particles bombardment Popovic N, Bogdanov Z, Goncic B, Zec S, Rakocevic Z, Zlatanovic M, Perusko D
292 - 296	Amorphous Ta-Si-N diffusion barriers on GaAs Kuchuk A, Kaminska E, Piotrowska A, Golaszewska K, Dynowska E, Lytvyn OS, Nowicki L, Ratajczak R
297 - 302	Zinc/manganese multilayer coatings for corrosion protection Munz R, Wolf GK, Guzman L, Adami M
303 - 307	Investigation of Ta grain boundary diffusion in copper by means of Auger electron spectroscopy Erdelyi G, Langer G, Nyeki J, Kover L, Tomastik C, Werner WM, Csik A, Stoeri H, Beke DL
308 - 312	Influence of defects in SiOx thin films on their barrier properties Gruniger A, von Rohr PR
313 - 317	On the coating of polymers - basic investigations Lugscheider E, Bobzin K, Maes M, Kramer A
318 - 322	High temperature ion beam erosion of polytetrafluoroethylene Adami M, Guzman L, Man BY, Miotello A, Ossi PM