Applied Surface Science

Applied Surface Science, Vol.252, No.19 Entire volume, number list

ISSN: 0169-4332 (Print)

In this Issue (219 articles)

XIX - XX	Secondary ion mass spectrometry SIMS XV - Proceedings of the Fifteenth International Conference on Secondary Ion Mass Spectrometry (SIMS XV) -The University of Manchester, UK September 12-16, 2005 - Preface Vickerman J, Gilmore I
6403 - 6403	Some new insights in to the mechanisms of fullerene and nanotube formation Kroto H
6404 - 6408	The contribution of mass spectrometry to the biosciences Gaskell SJ
6409 - 6412	Atoms, clusters and photons: Energetic probes for mass spectrometry Garrison BJ
6413 - 6418	Secondary ion emission from polymer layers by atomic and molecular ion bombardment: Data evaluation based on linear-cascade sputtering theory Wittmaack K
6419 - 6422	Sputtering of thin benzene and polystyrene overlayers by keV Ga and C-60 bombardment Czerwinski B, Delcorte A, Garrison B, Samson R, Winograd N, Postawa Z
6423 - 6425	Sputtering of amorphous ice induced by C-60 and Au-3 clusters Russo MF, Wojciechowski IA, Garrison BJ
6426 - 6428	Sputtering of clusters from nickel-aluminium King BV, Moore JF, Calaway WF, Veryovkin IV, Pellin MJ
6429 - 6432	Quantitative fundamental SIMS studies using O-18 implant standards Williams P, Sobers RC, Franzreb K, Lorincik J
6433 - 6435	4d core hole formation in silver and its role in Ag- secondary ion formation/survival van der Heide PAW
6436 - 6439	Coarse-grained molecular dynamics studies of cluster-bombarded benzene crystals Smiley EJ, Postawa Z, Wojciechowski IA, Winograd N, Garrison BJ
6440 - 6443	Caesium/xenon dual beam depth profiling: Velocity of the sputtered atom and ionization probability Brison J, Douhard B, Houssiau L
6444 - 6447	Sputter yields in diamond bombarded by ultra low energy ions de la Mata BG, Dowsett MG, Twitchen D
6448 - 6451	AFM study of the SIMS beam induced roughness in monocrystalline silicon in presence of initial surface or bulk defects of nanometric size Fares B, Dubois C, Gautier B, Dupuy JC, Cayrel F, Gaudin G
6452 - 6455	Determination of energy dependent ionization probabilities of sputtered particles Mazarov P, Samartsev AV, Wucher A
6456 - 6458	Characterizing SIMS transient effects apparent in matrix secondary ion signals from silicon under 1 keV Cs+ impact van der Heide PAW
6459 - 6462	Modeling the dissociation and ionization of a sputtered organic molecule Solomko V, Verstraete M, Delcorte A, Garrison BJ, Gonze X, Bertrand P
6463 - 6465	Bombardment induced surface chemistry on Si under keV C-60 impact Krantzman KD, Kingsbury DB, Garrison BJ
6466 - 6469	Molecular dynamics study of particle emission by reactive cluster ion impact Aoki T, Matsuo J
6470 - 6473	Kinetic energy distributions of neutral In and In-2 sputtered by polyatomic ion bombardment Samartsev AV, Wucher A
6474 - 6477	Yields and ionization probabilities of sputtered In, particles under atomic and polyatomic Au-m(-) ion bombardment Samartsev AV, Wucher A
6478 - 6481	Deconvolution of very low primary energy SIMS depth profiles2w Fares B, Gautier B, Dupuy JC, Prudon G, Holliger P
6482 - 6489	Molecular secondary ion formation under cluster bombardment: A fundamental review Wucher A
6490 - 6493	Molecular ion emission from single large cluster impacts Verkhoturov SV, Rickman RD, Guillemier C, Hager GJ, Locklear JE, Schweikert EA
6494 - 6497	Stretching the limits of static SIMS with C-60(+) Delcorte A, Poleunis C, Bertrand P
6498 - 6501	Molecular depth profiling of multi-layer systems with cluster ion sources Cheng J, Winograd N
6502 - 6505	Temperature-controlled depth profiling in polymeric materials using cluster secondary ion mass spectrometry (SIMS) Mahoney CM, Fahey AJ, Gillen G, Xu C, Batteas JD
6506 - 6508	Using polyatomic primary ions to probe an amino acid and a nucleic base in water ice Conlan XA, Biddulph GX, Lockyer NP, Vickerman JC
6509 - 6512	Chemical effects in C-60 irradiation of polymers Mollers R, Tuccitto N, Torrisi V, Niehuis E, Licciardello A
6513 - 6516	Molecular depth profiling of organic and biological materials Fletcher JS, Conlan XA, Lockyer NP, Vickerman JC
6517 - 6520	Probing thin over layers with variable energy/cluster ion beams Spool A, White R
6521 - 6525	Depth profiling using C60+SIMS - Deposition and topography development during bombardment of silicon Gillen G, Batteas J, Michaels CA, Chi P, Small J, Windsor E, Fahey A, Verkouteren J, Kim KJ
6526 - 6528	Fundamental studies of the cluster ion bombardment of water ice Szakal C, Kozole J, Winograd N
6529 - 6532	Influence of massive projectile size and energy on secondary ion yields from organic surfaces Guillermier C, Della Negra S, Rickman RD, Pinnick V, Schweikert EA
6533 - 6536	Sputtering yields of PMMA films bombarded by keV C60+ ions Bolotin IL, Tetzler SH, Hanley L
6537 - 6541	3D molecular imaging SIMS Gillen G, Fahey A, Wagner M, Mahoney C
6542 - 6546	Energy distributions of atomic and molecular ions sputtered by C-60(+) projectiles Delcorte A, Poleunis C, Bertrand P
6547 - 6549	Evaluation of secondary ion yield enhancement from polymer material by using TOF-SIMS equipped with a gold cluster ion source Aimoto K, Aoyagi S, Kato N, Iida N, Yamamoto A, Kudo M
6550 - 6553	High-intensity Si cluster ion emission from a silicon target bombarded with large Ar cluster ions Ninomiya S, Aoki T, Seki T, Matsuo J
6554 - 6557	Characterization of drug-eluting stent (DES) materials with cluster secondary ion mass spectrometry (SIMS) Mahoney CM, Patwardhan DV, McDermott MK
6558 - 6561	Au-analyte adducts resulting from single massive gold cluster impacts Hager GJ, Guillermier C, Verkhoturov SV, Schweikert EA
6562 - 6565	Polyethylene terephthalate (PET) bulk film analysis using C-60(+), Au-3(+), and Au+ primary ion beams Conlan XA, Gilmore IS, Henderson A, Lockyer NP, Vickerman JC
6566 - 6569	Influence of primary ion species on the secondary cluster ion emission process from SAMs of hexadecanethiol on gold Schroder M, Sohn S, Lipinsky D, Arlinghaus HF
6570 - 6574	SSIMS analysis of organics, polymer blends and interfaces Weng LT, Chan CM
6575 - 6581	Simplifying the interpretation of ToF-SIMS spectra and images using careful application of multivariate analysis Wagner MS, Graharn DJ, Castner DG
6582 - 6587	Matrix-enhanced secondary ion mass spectrometry: The Alchemist's solution? Delcorte A
6588 - 6590	Static ToF-SIMS analysis of plasma chemically deposited ethylene/allyl alcohol co-polymer films Oran U, Swaraj S, Friedrich JF, Unger WES
6591 - 6593	Mass accuracy- TOF-SIMS Green FM, Gilmore IS, Seah MP
6594 - 6596	Diffusion study of multi-organic layers in OLEDs by ToF-SIMS Chen WY, Ling YC, Chen BJ, Shih HH, Cheng CH
6597 - 6600	3D-TOFSIMS characterization of black spots in polymer light emitting diodes Bulle-Lieuwma CWT, van de Weiier P
6601 - 6604	G-SIMS-FPM: Molecular structure at surfaces- a combined positive and negative secondary ion study Gilmore IS, Green FM, Seah MP
6605 - 6608	SIMS studies of polymeric tertiary structures in monolayers: Polysiloxane helical coil structures Rey-Santos R, Piwowar A, Alvarado LZ, Gardella JA
6609 - 6614	SIMS depth profiling of polymer blends with protein based drugs Mahoney CM, Yu JX, Fahey A, Gardella JA
6615 - 6618	Depth profiling of taxol-loaded poly(styrene-b-isobutylene-b-styrene) using Ga+ and C-60(+) ion beams Braun RM, Cheng J, Parsonage EE, Moeller J, Winograd N
6619 - 6623	ToF-SIMS analysis of a fluorocarbon-grafted PET with a gold cluster ion source Zhu ZM, Kelley MJ
6624 - 6627	Matrix-enhanced cluster-SIMS Locklear JE, Guillermier C, Verkhoturov SV, Schweikert EA
6628 - 6631	S-SIMS and MetA-SIMS study of organic additives in thin polymer coatings Adriaensen L, Vangaever F, Lenaerts J, Gijbels R
6632 - 6635	Chemical derivatization technique in ToF-SIMS for quantification analysis of surface amine groups Lee TG, Kim J, Shon HK, Jung D, Moon DW
6636 - 6639	PLA-PMMA blends: A study by XPS and ToF-SIMS Cossement D, Gouttebaron R, Cornet V, Viville P, Hecq M, Lazzaroni R
6640 - 6643	Comparison of detection efficiencies of negatively charged gold-alkanethiolate-, gold-sulfur- and gold-clusters in ToF-SIMS Rietmann T, Sohn S, Schroder M, Lipinsky D, Arlinghaus HF
6644 - 6647	Organic SIMS with single massive gold projectile: Ion yield enhancement by silver metallization Guillermier C, Pinnick V, Verkhoturov SV, Schweikert EA
6648 - 6651	End group effect on surface and interfacial segregation in PS-PMMA blend thin films Kailas L, Bertrand P
6652 - 6655	Empirical evaluation of metal deposition for the analysis of organic compounds with static secondary ion mass spectrometry (S-SIMS) De Mondt R, Adriaensen L, Vangaever F, Lenaerts J, Van Vaeck L, Gijbels R
6656 - 6659	Static secondary ion mass spectrometry (S-SIMS) in advanced textile research: Study of additives in polypropylene (PP) films Boschmans B, Vanneste M, Ruys L, Van Vaeck L
6660 - 6663	Static secondary ion mass spectrometry (S-SIMS) analysis of atmospheric plasma treated polypropylene films Boschmans B, Vanneste M, Ruys L, Temmerman E, Leys C, Van Vaeck L
6664 - 6667	Development of a highly sensitive analytical technique for surfactants by time-of-flight secondary ion mass spectrometry Tanji N, Okamoto M
6668 - 6671	ToF-SIMS characterisation of diterpenoic acids after chromatographic separation Orinak A, Orinakova R, Arlinghaus HF, Vering G, Hellweg S, Cechinel V
6672 - 6675	Towards a fully optimised organic LED device: Analysis of surface synthesis using coupling reactions by ToF-SIMS Pinna R, Jamme F, Rutten FJM, Smith EF, Willis MR, Briggs D, McCoustra MRS
6676 - 6678	G-SIMS of thermosetting polymers Hawtin PN, Abel ML, Watts JF, Powell J
6679 - 6682	Quantitative and high mass ToF-SIMS studies of siloxane segregation in hydrogel polymers using cryogenic sample handling techniques Hook DJ, Valint PL, Chen L, Gardella JA
6683 - 6685	Effect of acrylic acid vapour on lubricated recording hard-disk media surfaces Ji R, Liew T, Chong TC
6686 - 6688	Chemistry of metal atoms reacting with alkanethiol self-assembled monolayers Zhu Z, Allara DL, Winograd N
6689 - 6692	Selective detection of organic compounds on modified polymer surfaces using TOF-SIMS in combination with derivatization Kwon M, Lee Y, Kim Y, Han S, Kim H
6693 - 6696	Surface spectroscopic imaging of PEG-PLA tissue engineering constructs with ToF-SIMS Tsourapas G, Rutten FJM, Briggs D, Davies MC, Shakesheff KM
6697 - 6701	Mutual information theory for biomedical applications: Estimation of three protein-adsorbed dialysis membranes Aoyagi S, Takesawa A, Yamashita AC, Kudo M
6702 - 6705	The influence of the cholesterol microenvironment in tissue sections on molecular ionization efficiencies and distributions in ToF-SIMS Altelaar AFM, van Minnen J, Heeren RMA, Piersma SR
6706 - 6708	Direct NanoSIMS imaging of diffusible elements in surfaced block of cryo-processed biological samples Hallegot P, Audinot JN, Migeon HN
6709 - 6711	Introduction of a cryosectioning-ToF-SIMS instrument for analysis of non-dehydrated biological samples Moller J, Beumer A, Lipinsky D, Arlinghaus HF
6712 - 6715	TOF-SIMS imaging of chlorhexidine-digluconate transport in frozen hydrated biofilms of the fungus Candida albicans Tyler BJ, Rangaranjan S, Moller J, Beumer A, Arlinghaus HE
6716 - 6718	Investigating lipid interactions and the process of raft formation in cellular membranes using ToF-SIMS McQuaw CM, Sostarecz AG, Zheng L, Ewing AG, Winograd N
6719 - 6722	ToF-SIMS studies of Bacillus using multivariate analysis with possible identification and taxonomic applications Thompson CE, Ellis J, Fletcher JS, Goodacre R, Henderson A, Lockyer NP, Vickerman JC
6723 - 6726	7.87 eV postionization of peptides containing tryptophan or derivatized with fluorescein Hanley L, Edirisinghe PD, Calaway WF, Veryovkin IV, Pellin MJ, Moore JF
6727 - 6730	Suppression and enhancement of non-native molecules within biological systems Jones EA, Lockyer NP, Vickerman JC
6731 - 6733	A comparative study of secondary ion yield from model biological membranes using Au-n(+) and C-60(+) primary ion sources Baker MJ, Fletcher JS, Jungnickel H, Lockyer NP, Vickerman JC
6734 - 6737	A new analysis of the depolymerized fragments of lignin polymer in the plant cell walls using ToF-SIMS Saito K, Kato T, Takamori H, Kishimoto T, Yamamoto A, Fukushima K
6738 - 6741	Bioactive molecules for biomimetic materials: Identification of RGD peptide sequences by TOF-S-SIMS analysis Poulin S, Durrieu MC, Polizu S, Yahia LH
6742 - 6745	Mass spectrometric characterization of DNA microarrays as a function of primary ion species Hellweg S, Jacob A, Hoheisel JD, Grehl T, Arlinghaus HF
6746 - 6749	Direct ToF-SIMS analysis of organic halides and amines on TLC plates Parent AA, Anderson TM, Michaelis DJ, Jiang GL, Savage PB, Linford MR
6750 - 6753	Nanoscale surface of carbon nanotube fibers for medical applications: Structure and chemistry revealed by TOF-SIMS analysis Polizu S, Maugey M, Poulin S, Poulin P, Yahia L
6754 - 6756	ToF-SIMS imaging of gradient polyethylene and its amine-functionalized surfaces Lee TG, Shon HK, Kim MS, Lee HB, Moon DW
6757 - 6760	Studies by imaging TOF-SIMS of bone mineralization on porous titanium implants after 1 week in bone Eriksson C, Borner K, Nygren H, Ohlson K, Bexell U, Billerdahl N, Johansson M
6761 - 6764	Characterisation of human hair surfaces by means of static ToF-SIMS: A comparison between Ga+ and C-60(+) primary ions Poleunis C, Everaert EP, Delcorte A, Bertrand P
6765 - 6769	Cations in mammalian cells and chromosomes: Sample preparation protocols affect elemental abundances by SIMS Levi-Setti R, Gavrilov KL, Neilly ME
6770 - 6773	Specific Mg2+ binding to AT-rich regions of chromatin in the evolution of eukaryotes Strissel PL, Gavrilov KL, Levi-Setti R, Strick R
6774 - 6776	Enhanced peptide molecular imaging using aqueous droplets Murayama Y, Komatsu M, Kuge K, Hashimoto H
6777 - 6781	Localization of Na+ and K+ in rat cerebellum with imaging TOF-SIMS Borner K, Nygren H, Malmberg P, Tallarek E, Hagenhoff B
6782 - 6785	Analysis of cardiac tissue by gold cluster ion bombardment Aranyosiova M, Chorvatova A, Chorvat D, Biro C, Velic D
6786 - 6788	Hair dye distribution in human hair by ToF-SIMS Chen BJ, Lee PL, Chen WY, Mai FD, Ling YC
6789 - 6792	Model multilayer structures for three-dimensional cell imaging Kozole J, Szakal C, Kurczy M, Winograd N
6793 - 6796	Dynamic SIMS analysis of cryo-prepared biological and geological specimens Dickinson M, Heard PJ, Barker JHA, Lewis AC, Mallard D, Allen GC
6797 - 6800	G-SIMS of biodegradable homo-polyesters Ogaki R, Green F, Li S, Vert M, Alexander MR, Gilmore IS, Davies MC
6801 - 6804	Quantitative ToF-SIMS study of surface-immobilized streptavidin Kim YP, Hong MY, Shon HK, Moon DW, Kim HS, Lee TG
6805 - 6808	TOF-SIMS investigation of the distribution of a cosmetic ingredient in the epidermis of the skin Okamoto M, Tanji N, Katayama Y, Okada J
6809 - 6812	Imaging of single liver tumor cells intoxicated by heavy metals using ToF-SIMS Mai FD, Chen BJ, Wu LC, Li FY, Chen WK
6813 - 6815	Study of the mechanism of diatom cell division by means of Si-29 isotope tracing Audinot JN, Guignard C, Migeon HN, Hoffmann L
6816 - 6819	Bioaccumulation of chromium in aquatic macrophyte Borreria scabiosoides Cham. & Schltdl. Mangabeira PA, Mielke MS, Arantes I, Dutruch L, Silva DD, Barbier F, de Almeida AAF, Oliveira AH, Severo MIG, Labejof L, Rocha DC, Rosa TS, Santana KB, Gavrilov KL, Galle P, Levi-Setti R, Grenier-Loustalot MF
6820 - 6820	Discussion on meeting the challenge of molecule specific analysis and imaging in organic and bio-systems Chair: Professor John C. Vickerman [Anonymous]
6821 - 6826	Molecule specific imaging in biology: What are the challenges and the important applications? Ewing AG
6827 - 6835	Why don't biologists use SIMS? A critical evaluation of imaging MS Heeren RMA, McDonnell LA, Amstalden E, Luxembourg SL, Altelaar AFM, Piersma SR
6836 - 6843	Improvements in SIMS continue - Is the end in sight? Winograd N, Postawa Z, Cheng J, Szakal C, Kozole J, Garrison BJ
6844 - 6854	ToF-SIMS analysis of bio-systems: Are polyatomic primary ions the solution? Jones EA, Fletcher JS, Thompson CE, Jackson DA, Lockyer NP, Vickerman JC
6855 - 6859	General discussion Castner D, Ewing AG, Heeren RMA, Lockyer NP, Winograd N
6860 - 6868	Information from complexity: Challenges of TOF-SIMS data interpretation Graham DJ, Wagner MS, Castner DG
6869 - 6874	Rapid discrimination of the causal agents of urinary tract infection using ToF-SIMS with chemometric cluster analysis Fletcher JS, Henderson A, Jarvis RM, Lockyer NP, Vickerman JC, Goodacre R
6875 - 6882	Multivariate statistical image processing for molecular specific imaging in organic and bio-systems Tyler BJ
6883 - 6890	Spatial statistics and interpolation methods for TOF SIMS imaging Milillo TM, Gardella JA
6891 - 6894	General discussion Gilmore I, Castner D, Gardella J, Goodacre R, Tyler B
6895 - 6906	Quantitative imaging of cells with multi-isotope imaging mass spectrometry (MIMS)-Nanoautography with stable isotope tracers McMahon G, Glassner BJ, Lechene CP
6907 - 6916	High resolution SIMS imaging of cations in mammalian cell mitosis, and in Drosophila polytene chromosomes Levi-Setti R, Gavrilov KL, Neilly ME, Strick R, Strissel PL
6917 - 6924	Specimen preparation for NanoSIMS analysis of biological materials Grovenor CRM, Smart KE, Kilburn MR, Shore B, Dilworth JR, Martin B, Hawes C, Rickaby REM
6925 - 6930	Sub-cellular localisation of a N-15-labelled peptide vector using NanoSIMS imaging Romer W, Wu TD, Duchambon P, Amessou M, Carrez D, Johannes L, Guerquin-Kern JL
6931 - 6934	General discussion Goodacre R
6935 - 6940	Development towards label- and amplification-free genotyping of genomic DNA Brandt O, Feldner J, Hellweg S, Schroder M, Stephan A, Arlinghaus HF, Hoheisel JD, Jacob A
6941 - 6948	Mass spectrometric characterization of elements and molecules in cell cultures and tissues Arlinghaus HF, Kriegeskotte C, Fartmann M, Wittig A, Sauerwein W, Lipinsky D
6949 - 6949	General discussion Winograd N
6950 - 6956	Quantitative analysis of supported membrane composition using the NanoSIMS Kraft ML, Fishel SF, Marxer CG, Weber PK, Hutcheon ID, Boxer SG
6957 - 6965	Imaging lipid distributions in model monolayers by ToF-SIMS with selectively deuterated components and principal components analysis Biesinger MC, Miller DJ, Harbottle RR, Possmayer F, McIntyre NS, Petersen NO
6966 - 6974	Localization of lipids in freeze-dried mouse brain sections by imaging TOF-SIMS Sjovall P, Johansson B, Lausmaa J
6975 - 6981	Localization of cholesterol in rat cerebellum with imaging TOF-SIMS -Effect of tissue preparation Nygren H, Borner K, Malmberg P, Hagenhoff B
6982 - 6985	General discussion Winograd N
6986 - 6991	Static SIMS for analysis of molecular conformation and orientation Bertrand P
6992 - 6995	Characterisation of electrospun nanowebs with static secondary ion mass spectrometry (S-SIMS) Van Royen P, dos Santos AM, Schacht E, Ruys L, Van Vaeck L
6996 - 6999	TOF-SIMS study of photocatalytic decomposition reactions on nanocrystalline TiO2 Gnaser H, Orendorz A, Ziegler C, Rowlett E, Bock W
7000 - 7002	Supramolecular host-guest complexes based on cyclodextrin-diphenylhexatriene Rabara L, Aranyosiova M, Velic D
7003 - 7005	Atomic distribution in quantum dots- A ToF-SIMS study Chen WY, Ling YC, Chen BJ, Wang CC
7006 - 7009	Characterization of individual atmospheric aerosol particles with SIMS and laser-SNMS Peterson RE, Nair A, Dambach S, Arlinghaus HF, Tyler BJ
7010 - 7013	Comparison of urban and rural particulate air pollution characteristics obtained by SIMS and SSMS Konarski P, Haluszka J, Cwil M
7014 - 7017	Analysis of volatile nanoparticles emitted from diesel engine using TOF-SIMS and metal-assisted SIMS (MetA-SIMS) Inoue M, Murase A, Yamamoto M, Kubo S
7018 - 7021	Quantitative characterizations of styrene-butadiene core-shell latexes by TOF-SIMS and pyrolysis GUMS Maekawa T
7022 - 7025	Characterization of individual complex particles in urban atmospheric environment Suzuki K, Takii T, Tomiyasu B, Nihei Y
7026 - 7029	TOF-SIMS measurements of the exhaust particles emitted from gasoline and diesel engine vehicles Tomiyasu B, Owari M, Nihei Y
7030 - 7033	Study of coating distribution onto metallic hollow particles Orinakova R, Orinak A, Arlinghaus HF, Hellweg S, Kupkova M, Kabatova M
7034 - 7037	Secondary ion statistics and determination of nanocluster (m > 10(7) amu) ion registration efficiency Novikov AV, Kirillov SN, Baranov IA, Obnorskii VV, Yarmiychuk SV
7038 - 7040	Study of the Pd-Rh interdiffusion by ToF-SIMS, RBS and PIXE: Semi-quantitative depth profiles with MCs+ clusters Brison J, Hubert R, Lucas S, Houssiau L
7041 - 7044	Secondary ionization mass spectrometric analysis of impurity element isotope ratios in nuclear reactor materials Gerlach DC, Cliff JB, Hurley DE, Reid BD, Little WW, Meriwether GH, Wickham AJ, Simmons TA
7045 - 7047	Application of SIMS analyses on oxygen transport in SOFC materials Sakai N, Yamaji K, Horita T, Kishimoto H, Brito ME, Yokokawa H, Uchimoto Y
7048 - 7050	Characterisation of irradiated nuclear fuel with SIMS Desgranges L, Valot C, Pasquet B
7051 - 7053	Study of the carbon distribution in multi-phase steels using the NanoSIMS 50 Valle N, Drillet J, Bouaziz O, Migeon HN
7054 - 7057	Strong composition-dependent variation of MCs+ calibration factors in TiOx and GeOx (x <= 2) films Gnaser H, Le YK, Su WF
7058 - 7061	RuO2/SiO2/Si and SiO2/porous Si/Si interfaces analysed by SIMS Cwil M, Konarski P, Pajak M, Bieniek T, Kosinski A, Kaczorek K
7062 - 7065	Examination of the influence of boron on the microstructure and properties of low C ferritic steels using NanoSIMS and TEM Ahmed S, Titchmarsh JM, Kilburn MR, Grovenor CRM
7066 - 7069	SIMS analysis of nitrogen in various metals and ZnO Li YP, Wang S, Smith SP
7070 - 7073	Sodium and hydrogen analysis of room temperature glass corrosion using low energy CsSIMS Fearn S, McPhail DS, Morris RJH, Dowsett MG
7074 - 7077	SIMS depth profiling of rubber-tyre cord bonding layers prepared using Zn-64 depleted ZnO Fulton WS, Sykes DE, Smith GC
7078 - 7081	SIMS characterisation of superconductive MgB2 layers prepared by ion implantation and pulsed plasma treatment Konarski P, Cwil M, Piekoszewski J, Stanislawski J
7082 - 7085	Characterization of laser-fired contacts in PERC solar cells: SIMS and TEM analysis applying advanced preparation techniques Zastrow U, Houben L, Meertens D, Grohe A, Brammer T, Schneiderlochner E
7086 - 7088	TOFSIMS analysis of Cu-SiC composites for thermal management applications Treichler R, Weissgaerber T, Kiendl T
7089 - 7095	The geological microprobe: The first 25 years of dating zircons Compston W, Clement SWJ
7096 - 7101	Applications of SIMS to cultural heritage studies Adriaens A, Dowsett MG
7102 - 7106	NanoSIMS: A new tool in cosmochemistry Hoppe P
7107 - 7112	Some applications of SIMS in conservation science, archaeometry and cosmochemistry McPhail DS
7113 - 7116	Investigation into the nature of historical tapestries using time of flight secondary ion mass spectrometry (ToF-SIMS) Batcheller J, Hacke AM, Mitchell R, Carr CM
7117 - 7119	Interstellar dust laser explorer (IDLE): A new instrument for submicron analyses of stardust-quantification of laser SNMS Henkel T, Tizard J, Blagburn D, Lyon I
7120 - 7123	Analysis of simulated hypervelocity impacts on a titanium fuel tank from the Salyut 7 space station Jantou V, McPhail DS, Chater RJ, Kearsley A
7124 - 7127	Surface analysis of ancient glass artefacts with ToF-SIMS: A novel tool for provenancing? Rutten FJM, Roe MJ, Henderson J, Briggs D
7128 - 7131	Measurement of sulfur isotope ratios in micrometer-sized samples by NanoSIMS Winterholler B, Hoppe P, Andreae MO, Foley S
7132 - 7135	uleSIMS characterization of silver reference surfaces Palitsin VV, Dowsett MG, de la Mata BG, Oloff IW, Gibbons R
7136 - 7139	TOF-SIMS analysis of corroding museum glass Fearn S, McPhail DS, Hagenhoff B, Tallarek E
7140 - 7143	ToF-SIMS applied to historical archaeology in the Alps Sodhi RNS, Mahaney WC, Milner MW
7144 - 7147	Obsidian hydration dating from SIMS H+ profiling based on saturated surface (SS) layer using new software Liritzis I, Ganetsos T
7148 - 7151	Automated ion imaging with the NanoSIMS ion microprobe Groner E, Hoppe P
7152 - 7154	SIMS quantification of very low hydrogen contents Rhede D, Wiedenbeck M
7155 - 7158	Preferential oxidation of chalcopyrite surface facets characterized by ToF-SIMS and SEM Al-Harahsheh M, Rutten F, Briggs D, Kingman S
7159 - 7162	High throughput screening of novel oxide conductors using SIMS Fearn S, Rossiny JCH, Kilner JA, Zhang Y, Chen L
7163 - 7166	Resonant laser-SNMS of boron for analysis of paleoceanographic samples Vering G, Crone C, Kathers P, Bijma J, Arlinghaus HF
7167 - 7171	Characterizing high-k and low-k dielectric materials for semiconductors: Progress and challenges Bennett J, Quevedo-Lopez M, Satyanarayana S
7172 - 7175	Characterization of HfO2 dielectric films with low energy SIMS Jiang ZX, Kim K, Lerma J, Sieloff D, Tseng H, Hegde RI, Luo TY, Yang JY, Triyoso DH, Tobin PJ
7176 - 7178	SIMS analysis of HfSiO(N) thin films Miwa S, Kusanagi S, Kobayashi H
7179 - 7181	Back side SIMS analysis of hafnium silicate Gu C, Stevie FA, Bennett J, Garcia R, GriffiS DP
7182 - 7185	A study of dynamic SIMS analysis of low-k dielectric materials Mowat IA, Lin XF, Fister T, Kendall M, Chao G, Yang MH
7186 - 7189	ToF-SIMS and AFM studies of low-k dielectric etching in fluorocarbon plasmas Lazzeri P, Hua X, Oehrlein G, Iacob E, Barozzi M, Bersani M, Anderle M
7190 - 7193	The reduction of the change of secondary ions yield in the thin SiON/Si system Sameshima J, Yamamoto H, Hasegawa T, Nishina T, Nishitani T, Yoshikawa K, Karen A
7194 - 7197	Thermal effects on H-1 and H-2 distributions determined by SIMS in atomic layer deposition of HfO2 and A1(2)O(3) using heavy water Holliger P, Hobbs C, Jalabert D, Martin F, Pierre F, Reimbold G, Rivallin P
7198 - 7200	Ultra low energy SIMS depth profiling of sub-1.5 nm silicon oxynitride films Mulcahy CPA, Bock B, Ebblewhite PA, Hebert HP, Biswas S
7201 - 7204	Depth profiling of emerging materials for semiconductor devices Ronsheim PA
7205 - 7207	Important increase of negative secondary ion sensitivity during SIMS analysis by neutral cesium deposition Philipp P, Wirtz T, Migeon HN, Scherrer H
7208 - 7210	SIMS quantitative depth profiling of matrix elements in semiconductor layers Guryanov G, Clair TPS, Bhat R, Caneau C, Nikishin S, Borisov B, Budrevich A
7211 - 7213	SIMS depth profiling of boron ultra shallow junctions using oblique O-2(+) beams down to 150 eV Juhel A, Laugier F, Delille D, Wyon C, Kwakman LFT, Hopstaken A
7214 - 7217	Comparison between the SIMS and MEIS techniques for the characterization of ultra shallow arsenic implants Giubertoni D, Bersani A, Barozzi M, Pederzoli S, Iacob E, van den Berg JA, Werner M
7218 - 7220	RF-plasma source qualification and compositional characterisation of GaNAs superlattices using SIMS Mulcahy CPA, Barker SJ, Williams RS, Hopkinson M, Ashwin M, Stavrinou PN, Parry G, Biswass S, Jones TS
7221 - 7223	Different optical conductivity enhancement (OCE) protocols to eliminate charging during ultra low energy SIMS profiling of semiconductor and semi-insulating materials Morris RJH, Dowsett MG, Chang RJH
7224 - 7227	SIMS depth profiling of deuterium labeled polymers in polymer multilayers Harton SE, Stevie FA, Griffis DP, Ade H
7228 - 7231	SIMS quantification of matrix and impurity species in AlxGa1-xN Gu CJ, Stevie FA, Hitzman CJ, Saripalli YN, Johnson M, Griffis DP
7232 - 7235	Round-robin study of arsenic implant dose measurement in silicon by SIMS Simons D, Kim K, Benbalagh R, Bennett J, Chew A, Gehre D, Hasegawa T, Hitzman C, Ko J, Lindstrom R, MacDonald B, Magee C, Montgomery N, Peres P, Ronsheim P, Yoshikawa S, Schuhmacher M, Stockwell W, Sykes D, Tomita A, Toujou F, Won J
7236 - 7238	Comparative study of negative cluster emission in sputtering of Si, Ge and their oxides Perego M, Ferrari S, Fanciulli M
7239 - 7242	Steady-state Cs surface concentration on Si and Ge after low energy Cs+ bombardment by SIMS Chen P, Janssens T, Vandervorst W
7243 - 7246	Narrow surface transient and high depth resolution SIMS using 250 eV O-2(+) Chanbasha AR, Wee ATS
7247 - 7251	High sensitivity analysis of atmospheric gas elements Miwa S, Nomachi I, Kitajima H
7252 - 7254	ToF-SIMS depth profiling of (Ga,Mn)As capped with amorphous arsenic: Effects of annealing time Bexell U, Stanciu V, Warnicke P, Osth M, Svedlindh P
7255 - 7257	Quantitative analysis of surface contaminants on silicon wafers by means of TOF-SIMS Rostam-Khani P, Philipsen J, Jansen E, Eberhard H, Vullings P
7258 - 7261	Determination of organic contaminations on Si wafer surfaces by static ToF-SIMS: Improvement of the detection limit with C-60(+) primary ions Poleunis C, Delcorte A, Bertrand P
7262 - 7264	Quantitative SIMS analysis of SiGe composition with low energy O-2(+) beams Jiang ZX, Kim K, Lerma J, Corbett A, Sieloff D, Kottke M, Gregory R, Schauer S
7265 - 7268	SIMS analysis of impurities and nitrogen isotopes in gallium nitride thin films Hajime H, Ohgaki T, Sakaguchi I, Ryoken H, Ohashi N, Yasumori A
7269 - 7271	"Non-destructive" B, P and As dosimetry using normal incidence oxygen Maul H, Ehrke HU, Loibl N, Schnurer-Patschan C
7272 - 7274	Phosphorous degassing from poly silicon under thermal exposure: A ToF-SIMS depth profile investigation Alberici SG, Piagge R
7275 - 7278	SIMS analysis of a multiple quantum well structure in a vertical cavity surface emitting laser using the mixing-roughness-information depth model Ootomo S, Maruya H, Seo S, Iwase F
7279 - 7282	SIMS and SEM analysis of In1-x-yAlxGayP LED structure grown on InxGa1-xP,P graded buffer Vincze A, Satka A, Peternai L, Kovac J, Hasenohrl S, Vesely M
7283 - 7285	The influence of impurity profile on ultra-shallow GaAs sidewall tunnel junction characteristics Ohno T, Oyama Y, Nishizawa JI
7286 - 7289	Influence of changes in the resistivity of the sample surface on ultra-shallow SIMS profiles for arsenic Barozzi M, Giubertoni D, Pederzoli S, Anderle M, Iacob E, Bersani M
7290 - 7292	Secondary ion measurements for oxygen cluster ion SIMS Ninomiya S, Aoki T, Seki T, Matsuo J
7293 - 7296	Shave-off depth profiling: Depth profiling with an absolute depth scale Nojima M, Maekawa A, Yamamoto T, Tomiyasu B, Sakamoto T, Owari M, Nihei Y
7297 - 7300	Implementing a SIMS ion source on the NRL trace element accelerator mass spectrometer Knies DL, Grabowski KS, Cetina C
7301 - 7303	Isotope ratio measurement with a multicollector detector on the cameca IMS nf Lorincik J, Hervig R, Franzreb K, Slodzian G, Williams P
7304 - 7307	The development of a range Of C-60 ion beam systems Hill R, Blenkinsopp R, Barber A, Everest C
7308 - 7311	Development of a ToF version of the desktop MiniSIMS utilising a continuous primary ion beam Eccles AJ, Vohralik P, Cliff B, Jones C, Long N
7312 - 7314	Performance of a C-60(+) ion source on a dynamic SIMS instrument Fahey AJ, Gillen G, Chi P, Mahoney CM
7315 - 7317	Boron ultra low energy SIMS depth profiling improved by rotating stage Bersani M, Giubertoni D, Iacob E, Barozzi M, Pederzoli S, Vanzetti L, Anderle M
7318 - 7320	SIMS analysis using a new novel sample stage Miwa S, Nomachi I, Kitajima H
7321 - 7325	Caesium sputter ion source compatible with commercial SIMS instruments Belykh SF, Palitsin V, Veryovkin IV, Kovarsky AP, Chang RJH, Adriaens A, Dowsett M, Adams F