화학공학소재연구정보센터
검색결과 : 17건
No. Article
1 On the analogy of the potential barrier of trenched JFET and JBS devices
Bellone S, Di Benedetto L, Licciardo GD
Solid-State Electronics, 120, 6, 2016
2 A model of the off-behaviour of 4H-SiC power JFETs
Bellone S, Di Benedetto L, Licciardo GD
Solid-State Electronics, 109, 17, 2015
3 Electrical Characteristics Temperature Dependence of 600V-class Deep Implanted Gate Vertical JFET
Mizukami M, Takikawa O, Imai S, Kinoshita K, Hatakeyama T, Domon T, Shinohe T
Materials Science Forum, 483, 881, 2005
4 A 600V deep-implanted gate vertical JFET
Mizukami M, Takikawa O, Murooka M, Imai S, Kinoshita K, Hatakeyama T, Tsukuda M, Saito W, Omura I, Shinohe T
Materials Science Forum, 457-460, 1217, 2004
5 Simulation study of 4H-SiC junction-gated MOSFETs from 300 K to 773 K
Lee HS, Koo SM, Zetterling CM, Danielsson E, Domeij M, Ostling M
Materials Science Forum, 457-460, 1437, 2004
6 Opportunities and technical strategies for silicon carbide device development
Cooper JA
Materials Science Forum, 389-3, 15, 2002
7 Masking process for high-energy and high-temperature ion implantation
Ohyanagi T, Onose H, Watanabe A, Someya T, Ohno T, Amemiya K, Kobayashi Y
Materials Science Forum, 389-3, 867, 2002
8 Application-oriented unipolar switching SiC devices
Friedrichs P, Mitlehner H, Schorner R, Dohnke KO, Elpelt R, Stephani D
Materials Science Forum, 389-3, 1185, 2002
9 A 600 VSiC trench JFET
Gupta RN, Chang HR, Hanna E, Bui C
Materials Science Forum, 389-3, 1219, 2002
10 A novel high-voltage normally-off 4H-SiC vertical JFET
Zhao JH, Li X, Tone K, Alexandrov P, Pan M, Weiner M
Materials Science Forum, 389-3, 1223, 2002