Applied Surface Science

Applied Surface Science, Vol.255, No.4 Entire volume, number list

ISSN: 0169-4332 (Print)

In this Issue (209 articles)

803 - 804	Proceedings of the Sixteenth International Conference on Secondary Ion Mass Spectrometry, SIMS XVI Preface Kudo M, Oiwa R, Yurimoto H
805 - 812	Semiconductor profiling with sub-nm resolution: Challenges and solutions Vandervorst W
813 - 815	Predicting secondary ion formation in molecular dynamics simulations of sputtering Weidtmann B, Duvenbeck A, Wucher A
816 - 818	Fundamental studies of molecular depth profiling and 3D imaging using Langmuir-Blodgett films as a model Zheng LL, Wucher A, Winograd N
819 - 823	C-60 sputtering of organics: A study using TOF-SIMS, XPS and nanoindentation Fisher GL, Dickinson M, Bryan SR, Moulder J
824 - 827	Molecular ion yield enhancement induced by gold deposition in static secondary ion mass spectrometry Wehbe N, Delcorte A, Heile A, Arlinghaus HF, Bertrand P
828 - 830	Trench formation and lateral damage induced by gallium milling of silicon Russo MF, Maazouz M, Giannuzzi LA, Chandler C, Utlaut M, Garrison BJ
831 - 833	Molecular depth profiling and imaging using cluster ion beams with femtosecond laser postionization Willingham D, Kucher A, Winograd N
834 - 836	State selective detection of sputtered Al neutrals by resonant laser ionization SNMS Hayashi S, Kubota N
837 - 840	Simulations of C-60 bombardment of Si, SiC, diamond and graphite Krantzman KD, Webbb RP, Garrison BJ
841 - 843	Molecular dynamics simulations of sputtering of organic overlayers by slow, large clusters Rzeznik L, Czerwinski B, Garrison BJ, Winograd N, Postawa Z
844 - 846	Angle of incidence effects in a molecular solid Ryan KE, Smiley EJ, Winograd N, Garrison BJ
847 - 851	Dynamic SIMS ion microscopy imaging of individual bacterial cells for studies of isotopically labeled molecules Chandra S, Pumphrey G, Abraham JM, Madsen EL
852 - 855	G-SIMS and SMILES: Simulated fragmentation pathways for identification of complex molecules, amino acids and peptides Green FM, Gilmore IS, Seah MP
856 - 859	Fragment distribution of thermal decomposition for PS and PET with QMD calculations by considering the excited and charged model molecules Endo K, Masumoto C, Matsumoto D, Ida T, Mizuno M, Kato N
860 - 862	SIMS depth profile analysis of sodium in silicon dioxide Yamamoto Y, Shimodaira N
863 - 865	Assessment of the Nd/U ratio for the quantification of neodymium in UO2 Desgranges L, Pasquet B, Roure I, Portier S, Bremier S, Walker CT, Hasnaoui R, Gavillet D, Martin M, Raimbault L
866 - 869	The Storing Matter technique: Preliminary results on PS and PVC Philipp P, Douhard B, Lacour F, Wirtz T, Houssiau L, Pireaux JJ, Migeon HN
870 - 873	Angular distribution of sputtered matter under Cs+ bombardment with oblique incidence Verdeil C, Wirtz T, Migeon HN, Scherrer H
874 - 876	Monoatomic and cluster beam effect on ToF-SIMS spectra of self-assembled monolayers on gold Tuccitto N, Torrisi V, Delfanti I, Licciardello A
877 - 879	Critical distance for secondary ion formation: Experimental SIMS measurements Kudriavtsev Y, Gallardo S, Villegas A, Ramirez G, Asomoza R
880 - 882	Secondary ion emission from Si bombarded with large Ar cluster ions under UHV conditions Ninomiya S, Ichiki K, Nakata Y, Honda Y, Seki T, Aoki T, Matsuo J
883 - 885	Desorption of cluster ions from adsorbed methane under cryogenic condition by low-energy ion irradiation Narita A, Honda M, Hirao N, Baba Y, Yaita T
886 - 889	Controlling energy deposition during the C-60(+) bombardment of silicon: The effect of incident angle geometry Kozole J, Winograd N
890 - 892	Substrate effects on the analysis of biomolecular layers using Au+, Au-3(+) and C-60(+) bombardments Kordys J, Fletcher JS, Lockyer NP, Vickerman JC
893 - 896	Friction model to describe cluster bombardment Ryan KE, Russo MF, Smiley EJ, Postawa Z, Garrison BJ
897 - 900	Combined simulations and analytical model for predicting trends in cluster bombardment Russo MF, Ryan KE, Czerwinski B, Smiley EJ, Postawa Z, Garrison BJ
901 - 904	Resonance enhanced multi-photon ionization of neutral atoms sputtered with Ga-FIB Koizumi M, Sakamoto T
905 - 907	Quantum molecular dynamics simulation for fragmentation of arginine molecule induced by ion impact Kato N, Kudo M
908 - 911	Effect of residual oxygen on ionization processes of Si+ and Si2+ sputtered from Si(111)-7 x 7 surface Sakuma Y, Kato M, Shinde N, Yagi S, Soda K
912 - 915	Investigation of molecular weight effects of polystyrene in ToF-SIMS using C-60(+) and Au+ primary ion beams Piwowar AM, Lockyer N, Vickerman JC
916 - 921	Cluster SIMS using metal cluster complex ions Fujiwara Y, Kondou K, Teranishi Y, Watanabe K, Nonaka H, Saito N, Itoh H, Fujimoto T, Kurokawa A, Ichimura S, Tomita M
922 - 925	TOF-SIMS investigation of Streptomyces coelicolor, a mycelial bacterium Vaidyanathan S, Fletcher JS, Lockyer NP, Vickerman JC
926 - 928	Depth profiling of cells and tissues by using C-60(+) and SF5+ as sputter ions Malmberg P, Kriegeskotte C, Arlinghaus HF, Hagenhoff B, Holmgren J, Nilsson M, Nygren H
929 - 933	Imaging macrophages in trehalose with SIMS Parry SA, Kurczy ME, Fan X, Halleck MS, Schlegel RA, Winograd N
934 - 937	Artifacts in the sputtering of inorganics by C-60(n+) Lee JLS, Seah MP, Gilmore IS
938 - 940	Analysis of TOF-SIMS spectra from fullerene compounds Kato N, Yamashita Y, Iida S, Sanada N, Kudo M
941 - 943	Metal-assisted SIMS and cluster ion bombardment for ion yield enhancement Heile A, Lipinsky D, Wehbe N, Delcorte A, Bertrand P, Felten A, Houssiau L, Pireaux JJ, De Mondt R, Van Vaeck L, Arlinghaus HF
944 - 947	MD simulation study of the sputtering process by high-energy gas cluster impact Aoki T, Seki T, Ninomiya S, Matsuo J
948 - 950	Extremely low-energy projectiles for SIMS using size-selected gas cluster ions Moritani K, Hashinokuchi M, Nakagawa J, Kashiwagi T, Toyoda N, Mochiji K
951 - 953	The effect of angle of incidence to low damage sputtering of organic polymers using a C-60 ion beam Miyayama T, Sanada N, Iida SI, Hammond JS, Suzuki M
954 - 958	On the road to high-resolution 3D molecular imaging Delcorte A
959 - 961	Molecular depth profiling of trehalose using a C-60 cluster ion beam Wucher A, Cheng J, Winograd N
962 - 965	C-60 ion sputtering of layered organic materials Shard AG, Green FM, Gilmore IS
966 - 969	Depth profiling of organic materials using improved ion beam conditions Cramer HG, Grehl T, Kollmer F, Moellers R, Niehuis E, Rading D
970 - 972	Molecular depth profiling of polymers with very low energy ions Houssiau L, Douhard B, Mine N
973 - 976	MCsn+ cluster formation on organic surfaces: A novel way to depth-profile organics? Mine N, Douhard B, Houssiau L
977 - 980	ToF-SIMS study of growth behavior in all-nanoparticle multilayer films using a novel indicator layer Chen BJ, Yin YS, Ling YC
981 - 983	ToF-SIMS study of chemical composition and formation of all-nanoparticle multilayer films Chen BJ, Yin YS, Ling YC
984 - 986	Three-dimensional molecular imaging using mass spectrometry and atomic force microscopy Wucher A, Cheng J, Zheng LL, Willingham D, Winograd N
987 - 991	Analysis of surface and bulk polymerization of a thin film using a chemical derivatization technique and TOF-SIMS Maekawa T, Senga T
992 - 996	Towards quantitative chemical imaging with ToF-SIMS Wagner MS
997 - 1000	TOF-SIMS analysis of polystyrene/polybutadiene blend using chemical derivatization and multivariate analysis Kono T, Iwase E, Kanamori Y
1001 - 1005	Lamellar orientation on the surface of a polymer determined by ToF-SIMS and AFM Lau YTR, Weng LT, Ng KM, Chan CM
1006 - 1010	Nano- and microstructured polymer LB layers: A combined AFM/SIMS study Torrisi V, Tuccitto N, Delfanti I, Audinot JN, Zhavnerko G, Migeon HN, Licciardello A
1011 - 1014	Photocatalytic decomposition of methylene blue and 4-chlorophenol on nanocrystalline TiO2 films under UV illumination: A ToF-SIMS study Orendorz A, Ziegler C, Gnaser H
1015 - 1017	Comparison of secondary ion intensity enhancement from polymers on silicon and silver substrates by using Au-TOF-SIMS Kudo M, Aimoto K, Sunagawa Y, Kato N, Aoyagi S, Iida S, Sanada N
1018 - 1021	Influences of water on photoresist surface in immersion lithography technology Sado M, Teratani T, Fujii H, Iikawa R, Iida H
1022 - 1024	Mapping of the cationic starch adsorbed on pulp fibers by ToF-SIMS Matsushita Y, Suzuki A, Sekiguchi T, Saito K, Imai T, Fukushima K
1025 - 1028	ToF-SIMS study on the cleaning methods of Au surface and their effects on the reproducibility of self-assembled monolayers Min H, Park JW, Shon HK, Moon DW, Lee TG
1029 - 1032	Primary ion fluence dependence in time-of-flight SIMS of self-assembled monolayer of alkyl thiol molecules on Au(111)-Discussion of static limit Ghonaim NW, Nieradko M, Xi L, Nie HY, Francis JT, Grizzi O, Yeung KKC, Lau LWM
1033 - 1036	Investigation of natural dyes and ancient textiles from korea using TOF-SIMS Lee Y, Lee J, Kim Y, Choi S, Ham SW, Kim KJ
1037 - 1039	Quantitative analysis of mixed self-assembled monolayers using ToF-SIMS Min H, Jung G, Moon DW, Choi IS, Lee TG
1040 - 1043	Simulation of SIMS for monomer and dimer of lignin under the assumption of thermal decomposition using QMD method Kato K, Endo K, Matsumoto D, Ida T, Saito K, Fukushima K, Kato N
1044 - 1047	Quantitative analysis of organic additive content in a polymer by ToF-SIMS with PCA Ito H, Kono T
1048 - 1051	Fragment distribution of thermal decomposition for lignin monomer by QMD calculations using the excited and charged model molecules Endo K, Matsumoto D, Kato K, Takagi Y, Ida T, Mizuno M, Saito K, Fukushima K, Kato N
1052 - 1054	Improvement of sensitivity using principal component analysis by dual focused ion beam time-of-flight secondary ion mass spectrometry Morita Y, Owari M
1055 - 1057	The effect of C-60 cluster ion beam bombardment in sputter depth profiling of organic-inorganic hybrid multiple thin films Shon HK, Lee TG, Kim DH, Kang HJ, Lee BH, Sung MM, Moon DW
1058 - 1063	Possibilities and limitations of high-resolution mass spectrometry in life sciences Arlinghaus HF
1064 - 1067	Gold nanoparticle-enhanced secondary ion mass spectrometry and its bio-applications Kim YP, Oh E, Shon HK, Moon DW, Lee TG, Kim HS
1068 - 1070	The effect of incident angle on the C-60(+) bombardment of molecular solids Kozole J, Willingham D, Winograd N
1071 - 1074	TOF-SIMS structural characterization of self-assembly monolayer of cytochrome b5 onto gold substrate Aoyagi S, Rouleau A, Boireau W
1075 - 1078	ToF-SIMS investigation of FIB-patterning of lactoferrin by using self-assembled monolayers of iron complexes Tuccitto N, Giamblanco N, Marletta G, Licciardello A
1079 - 1083	Imaging subcellular features of a sectioned rat brain using time-of-flight secondary ion mass spectrometry and scanning probe microscopy Nie HY, Francis JT, Taylor AR, Walzak MJ, Chang WH, MacFabe DF, Lau WM
1084 - 1087	ToF-SIMS PC-DFA analysis of prostate cancer cell lines Baker MJ, Gazi E, Brown MD, Clarke NW, Vickerman JC, Lockyer NP
1088 - 1091	Chemical differences between sapwood and heartwood of Chamaecyparis obtusa detected by ToF-SIMS Saito K, Mitsutani T, Imai T, Matsushita Y, Yamamoto A, Fukushima K
1092 - 1095	TOF-SIMS analysis of the interface between bone and titanium implants-Effect of porosity and magnesium coating Nygren H, Eriksson C, Hederstierna K, Malmberg P
1096 - 1099	Evaluation of oriented lysozyme immobilized with monoclonal antibody Aoyagi S, Okada K, Shigyo A, Man N, Karen A
1100 - 1103	TOF-SIMS analysis of magnetic materials in chum salmon head Yano A, Aoyagi S
1104 - 1106	Evaluation of immobilized-lysozyme by means of TOF-SIMS Okada K, Aoyagi S, Dohi M, Kato N, Kudo M, Tozu M, Miyayama T, Sanada N
1107 - 1109	Marker experiments to determine diffusing species and diffusion path in medical Nitinol alloys Lutz J, Lindner JKN, Mandl S
1110 - 1112	Protein quantification on dendrimer-activated surfaces by using time-of-flight secondary ion mass spectrometry and principal component regression Kim YP, Hong MY, Shon HK, Chegal W, Cho HM, Moon DW, Kim HS, Lee TG
1113 - 1115	A new approach for preventing charging up of soft material samples by coating with conducting polymers in SIMS analysis Mise T, Ishikawa M, Nishimoto K, Meguro T
1116 - 1118	Investigation of the cosmetic ingredient distribution in the stratum corneum using NanoSIMS imaging Tanji N, Okamoto M, Katayama Y, Hosokawa M, Takahata N, Sano Y
1119 - 1122	Differentiation between human normal colon mucosa and colon cancer tissue using ToF-SIMS imaging technique and principal component analysis Park JW, Shon HK, Yoo BC, Kim IH, Moon DW, Lee TG
1123 - 1125	Behcet brain tissue identified with increased levels of Si and Al Aranyosiova M, Kopani M, Rychly B, Jakubovsky J, Velic D
1126 - 1130	ToF-SIMS cluster ion imaging of hippocampal CA1 pyramidal rat neurons Francis JT, Nie HY, Taylor AR, Walzak MJ, Chang WH, MacFabe DF, Lau WM
1131 - 1134	Molecular imaging of enhanced Na+ expression in the liver of total sleep deprived rats by TOF-SIMS Chang HM, Chen BJ, Wu UI, Huang YL, Mai FD
1135 - 1138	Up-regulation of Na+ expression in the area postrema of total sleep deprived rats by TOF-SIMS analysis Mai FD, Chen BJ, Ling YC, Wu UI, Huang YL, Chang HM
1139 - 1142	Interaction between diesel exhaust particles and cellular oxidative stress Suzuki K, Komatsu T, Kubo-Irie M, Tabata M, Takeda K, Nihei Y
1143 - 1147	Application of ToF-SIMS to the study on heartwood formation in Cryptomeria japonica trees Kuroda K, Imai T, Saito K, Kato T, Fukushima K
1148 - 1150	High sputtering yields of organic compounds by large gas cluster ions Ichiki K, Ninomiya S, Nakata Y, Honda Y, Seki T, Aoki T, Matsuo J
1151 - 1153	Cesium pre-implantation of embedded biological sections Galle P, Levi-Setti R, Labejof L, Kaitasov O
1154 - 1157	Accumulations of Ca/P in the core of hairs from Taklamakan desert mummies Hallegot P, Walter P, Cotte M, Audinot JN, Guillot J, Migeon HN, Tallarek E, Hagenhoff B
1158 - 1161	Relative quantification of cellular sections with molecular depth profiling ToF-SIMS imaging Kurczy ME, Kozole J, Parry SA, Piehowski PD, Winograd N, Ewing AG
1162 - 1164	Protein fragment imaging using ink jet printing digestion technique Komatsu M, Murayama Y, Hashimoto H
1165 - 1169	ToF-SIMS and SEM-EDS analysis of the surface of chosen bioindicators Szynkowska MI, Pawlaczyk A, Rogowski J
1170 - 1173	Quantitative ToF-SIMS studies of protein drug release from biodegradable polymer drug delivery membranes Burns SA, Gardella JA
1174 - 1176	Introduction of ice protective film for 3D microscale analysis of biological sample Iwanami T, Kinoshita K, Nojima M, Owari M
1177 - 1180	TOF-SIMS analysis of adipose tissue from patients with chronic kidney disease Sjovall P, Johansson B, Belazi D, Stenvinkel P, Lindholm B, Lausmaa J, Schalling M
1181 - 1184	SIMS imaging of gadolinium isotopes in tissue from Nephrogenic Systemic Fibrosis patients: Release of free Gd from magnetic resonance imaging (MRI) contrast agents Abraham JL, Chandra S, Thakral C, Abraham JM
1185 - 1189	Visualisation of thyroid hormone synthesis by ion imaging Audinot JN, Senou M, Migeon HN, Many MC
1190 - 1192	Investigating lipid-lipid and lipid-protein interactions in model membranes by ToF-SIMS Zheng L, McQuaw CM, Baker MJ, Lockyer NP, Vickerman JC, Ewing AG, Winograd N
1193 - 1193	Discussions on fundamentals and bio-imaging chair: Professor Peter Williams and Professor John C. Vickerman Murase A
1194 - 1200	Formation of atomic secondary ions in sputtering Wucher A
1201 - 1205	Oxygen O18 method and the search for the ionization mechanism in sputtering of oxygenated surfaces Lorincik J, Sroubek Z
1206 - 1214	The fate of the (reactive) primary ion: Sputtering and desorption Vandervorst W, Janssens T, Huyghebaert C, Berghmans B
1215 - 1216	The fate of the (reactive) primary ion: Sputtering and desorption -General discussion Williams P, Wucher A, Janssens T, Garrison B, Lorincik J, Gnaser H, Janssens T, Williams P
1217 - 1222	Energy dependence of projectiles on ion formation in electrospray droplet impact SIMS Asakawa D, Mori K, Hiraoka K
1223 - 1228	What do we want from computer simulation of SIMS using clusters? Webb RP
1229 - 1234	Sputtering of organic molecules by clusters, with focus on fullerenes Delcorte A, Wehbe N, Bertrand P, Garrison BJ
1235 - 1238	What size of cluster is most appropriate for SIMS? Matsuo J, Ninomiya S, Nakata Y, Honda Y, Ichiki K, Seki T, Aoki T
1239 - 1240	What size of cluster is most appropriate for SIMS? - General Discussion Williams P, Urbassek H, Hiraoka K, Boxer S, Wucher A, Matsuo J, Postawa Z, Vickerman J, Webb R, Garrison B, Gillen G, Krantzman K, Hagenhoff B, Delcorte A, Bertrand P
1241 - 1248	Biochemical imaging of tissues by SIMS for biomedical applications Lee TG, Park JW, Shon HK, Moon DW, Choi WW, Li K, Chung JH
1249 - 1256	The chemical composition of animal cells reconstructed from 2D and 3D ToF-SIMS analysis Breitenstein D, Rommel CE, Stolwijk J, Wegener J, Hagenhoff B
1257 - 1263	Construction of a novel stigmatic MALDI imaging mass spectrometer Hazama H, Aoki J, Nagao H, Suzuki R, Tashima T, Fujii K, Masuda K, Awazu K, Toyoda M, Naito Y
1264 - 1270	Uncovering new challenges in bio-analysis with ToF-SIMS Fletcher JS, Henderson A, Biddulph GX, Vaidyanathan S, Lockyer NP, Vickerman JC
1271 - 1272	Uncovering new challenges in bio-analysis with ToF-SIMS - General Discussion Boxer S, Moon DW, Breitenstein D, Naito Y, Fletcher J, Heeren, Castner, Setou, Hagenhoff, Gardella, McArthur, Parry, Lockyer
1273 - 1284	Challenges of biological sample preparation for SIMS imaging of elements and molecules at subcellular resolution Chandra S
1285 - 1288	The cytochemistry of anaplastic thyroid tumour cells and differentiated thyrocytes analyzed by TOF-SIMS and depth profiling Nygren H, Malmberg P, Nilsson M, Kriegeskotte C, Arlinghaus HF
1289 - 1297	Quality of surface: The influence of sample preparation on MS-based biomolecular tissue imaging with MALDI-MS and (ME-)SIMS Heeren RMA, Kukrer-Kaletas B, Taban IM, MacAleese L, McDonnell LA
1298 - 1304	Which is more important in bioimaging SIMS experiments-The sample preparation or the nature of the projectile? Kurczy ME, Piehowski PD, Parry SA, Jiang M, Chen G, Ewing AG, Winograd N
1305 - 1306	Which is more important in bioimaging SIMS experiments-The sample preparation or the nature of the projectile? General Discussion Vickerman J, Chandra S, Nygren H, Heeren R, Winograd N, Tyler, Moon, Walker, Clode, Breitenstein, Peterson, Setou, Hagenhoff, Vaidyanathan, Heien, Fletcher
1307 - 1310	Ultralow-energy SIMS for shallow semiconductor depth profiling Chanbasha AR, Wee ATS
1311 - 1315	Accuracy of calibrated depth by delta-doped reference materials in shallow depth profiling Tomita M, Tanaka H, Koike M, Kinno T, Hori Y, Yoshida N, Sasaki T, Takeno S
1316 - 1319	Cesium near-surface concentration in low energy, negative mode dynamic SIMS Berghmans B, Van Daele B, Geenen L, Conard T, Franquet A, Vandervorst W
1320 - 1322	Segregation under low-energy oxygen bombardment in the near-surface region Tada Y, Suzuki K, Kataoka Y
1323 - 1326	SIMS analysis of Kr-83 implanted UO2 Portier S, Bremier S, Hasnaoui R, Bildstein O, Walker CT
1327 - 1330	SIMS depth profiles of alloying elements in surface layers formed in Cu-based alloys during annealing Suzuki S, Shibata H, Ito M, Kimura T
1331 - 1333	Depth distribution of Cs implanted into Si at steady-state during dual beam ToF-SIMS profiling Vitchev RG, Brison J, Houssiau L
1334 - 1337	Fluorine-doped SiO2 and fluorocarbon low-k dielectrics investigated by SIMS Cwil M, Kalisz M, Konarski P
1338 - 1340	Factorial analysis of cluster-SIMS depth profiling using metal-cluster-complex ion beams Fujiwara Y, Kondou K, Watanabe K, Nonaka H, Saito N, Fujimoto T, Kurokawa A, Ichimura S, Tomita M
1341 - 1344	SIMS characterization of segregation in InAs/GaAs heterostructures Gallardo S, Kudriatsev Y, Villegas A, Ramirez G, Asomoza R, Cruz-Hernandez E, Rojas-Ramirez JS, Lopez-Lopez M
1345 - 1347	Silicon isotope superlattices: Ideal SIMS standards for shallow junction characterization Shimizu Y, Takano A, Itoh KM
1348 - 1350	Evaluation of sputtering rate change in the silicon transient region under medium energy O-2(+) sputtering Takano A, Takenaka H
1351 - 1353	Charge neutralization using secondary electron shower for shave-off depth profiling by focused ion beam secondary ion mass spectrometry Ishizaki Y, Yamamoto T, Fujii M, Owari M, Nojima M, Nihei Y
1354 - 1356	Highly accurate shave-off depth profiling by simulation method Fujii M, Nakamura K, Ishizaki Y, Nojima M, Owari M, Nihei Y
1357 - 1359	The optimization of incident angles of low-energy oxygen ion beams for increasing sputtering rate on silicon samples Sasaki T, Yoshida N, Takahashi M, Tomita M
1360 - 1363	Towards quantitative depth profiling with high spatial and high depth resolution Vanhove N, Lievens P, Vandervorst W
1364 - 1367	Quantification in dynamic SIMS: Current status and future needs Stevie FA, Griffis DP
1368 - 1372	Ripple morphologies on ion irradiated Si1-xGex Sarkar S, Van Daele B, Vandervorst W
1373 - 1376	Micro-area analysis in SIMS depth profiling by mesa-structure preparation Seki S, Tamura H, Wada Y, Tsutsui K, Ootomo S
1377 - 1380	Quantitative SIMS measurement of high concentration of boron in silicon (up to 20 at.%) using an isotopic comparative method Dubois C, Prudon G, Gautier B, Dupuy JC
1381 - 1383	SIMS depth profiling and TEM imaging of the SIMS altered layer Christofi A, Walker JF, McPhail DS
1384 - 1386	Oxygen flooding and sample cooling during depth profiling of HfSiON thin films Miwa S
1387 - 1390	Influence of primary ion beam irradiation conditions on the depth profile of hydrogen in tantalum film Asakawa T, Nagano D, Denda S, Miyairi K
1391 - 1394	Investigation of surface morphology of SiC during SIMS analysis Fukumoto N, Mizukami Y, Yoshikawa S, Morita H
1395 - 1399	Investigations of semiconductor devices using SIMS; diffusion, contamination, process control Lee JC, Won J, Chung Y, Lee H, Lee E, Kang D, Kim C, Choi J, Kim J
1400 - 1403	Shave-off vector profiling for TEM samples Nojima M, Fujii M, Ishizaki Y, Owari M, Nihei Y
1404 - 1407	Application of TOF-SIMS for high precision ion implant dosimetry: Possibilities and limitations Grehl T, Mollers R, Niehuis E, Rading D
1408 - 1411	Characterization of post-etched photoresist and residues by various analytical techniques Franquet A, Claes M, Conard T, Kesters E, Vereecke G, Vandervorst W
1412 - 1414	Quantification of SiGe layer composition using MCs+ and MCs2+ secondary ions in ToF-SIMS and magnetic SIMS Marseilhan D, Barnes JP, Fillot F, Hartmann JM, Holliger P
1415 - 1418	Quantitative static Time-of-Flight Secondary Ion Mass Spectrometry analysis of anionic minority species in microelectronic substrates Ravanel X, Trouiller C, Juhel M, Wyon C, Kwakman LFT, Leonard D
1419 - 1422	Preparation and properties of ZnO layers grown by various methods Vincze A, Kovac J, Novotny I, Bruncko J, Hasko D, Satka A, Shtereva K
1423 - 1426	SIMS depth profiling analysis of halogens in CdTe/CdS/TSO solar cells using Cs2M+ cluster ions Koudriavtseva O, Morales-Acevedo A, Kudriavtsev Y, Gallardo S, Asomoza R, Mendoza-Perez R, Sastre-Hernandez J, Contreras-Puente G
1427 - 1429	Long-term reproducibility of relative sensitivity factors obtained with CAMECA Wf Gui D, Xing ZX, Huang YH, Mo ZQ, Hua YN, Zhao SP, Cha LZ
1430 - 1432	Film thickness determining method of the silicon isotope superlattices by SIMS Takano A, Shimizu Y, Itoh KM
1433 - 1436	Roughness development in the depth profiling with 500 eV O-2(+) beam with the combination of oxygen flooding and sample rotation Gui D, Xing ZX, Huang YH, Mo ZQ, Hua YN, Zhao SP, Cha LZ
1437 - 1439	Depth profiling of ultra-thin oxynitride gate dielectrics by using MCs2+ technique Gui D, Mo ZQ, Xing ZX, Huang YH, Hua YN, Zhao SP, Cha LZ
1440 - 1442	Static time-of-flight secondary ion mass spectrometry analysis of microelectronics related substrates using a polyatomic ion source Ravanel X, Trouiller C, Juhel M, Wyon C, Kwakman LFT, Leonard D
1443 - 1445	Characterization of ionic migration on CoF substrate by ToF-SIMS Mogi S, Wada M, Matsumura Y, Tabira Y
1446 - 1450	Isotopic imaging of refractory inclusions in meteorites with the NanoSIMS 50L Ito M, Messenger S
1451 - 1454	Invisible gold and arsenic in pyrite from the high-grade Hishikari gold deposit, Japan Morishita Y, Shimada N, Shimada K
1455 - 1457	Investigation of radiation enhanced diffusion of magnesium in substrates flown on the NASA genesis mission King BV, Pellin MJ, Burnett DS
1458 - 1460	Discovery of O-17,O-18-rich material from meteorite by direct-imaging method using stigmatic-SIMS and 2D ion detector Sakamoto N, Itoh S, Yurimoto H
1461 - 1464	MegaSIMS: a SIMS/AMS hybrid for measurement of the Sun's oxygen isotopic composition Mao PH, Burnett DS, Coath CD, Jarzebinski G, Kunihiro T, McKeegan KD
1465 - 1467	NanoSIMS analysis of Archean fossils and biomarkers Kilburn MR, Wacey D
1468 - 1471	Identification of silicate and carbonaceous presolar grains by SIMS in the type-3 enstatite chondrite ALHA81189 Ebata S, Fagan TJ, Yurimoto H
1472 - 1475	CAMECA IMS 7f-GEO: Specialized SIMS tool for geosciences Peres P, de Chambost E, Schuhmacher M
1476 - 1478	Calculation of radiogenic Mg-26 of CAI minerals under high precision isotope measurement by SIMS Itoh S, Makide K, Yurimoto H
1479 - 1481	SIMS-AMS depth profiles for NASA Genesis samples: Preliminary measurements Cetina C, Grabowski KS, Knies DL, Demoranville LT
1482 - 1485	Mapping hard magnetic recording disks by TOF-SIMS Spool A, Forrest J
1486 - 1489	ToF-SIMS investigation of the cationization of several lubricant components Gunst U, Arlinghaus HF
1490 - 1493	TOF-SIMS analysis for thermal effect study of hard disk lubricant Ji R, Liew T, Chong TC
1494 - 1497	TOF-SIMS analysis of friction surfaces of hard coatings tested in engine oil Murase A, Mori H, Ohmori T
1498 - 1500	Storing Matter: A new quantitative and sensitive analytical technique Wirtz T, Migeon HN
1501 - 1504	The Storing Matter technique: Application to inorganic samples Philipp P, Lacour F, Wirtz T, Houssiau L, Pireaux JJ, Migeon HN
1505 - 1508	A portable aerosol sampler for individual particle analysis by means of TOF-SIMS Yamaguchi J, Sakamoto T
1509 - 1511	Characterization of pebble surfaces coated with biogenic manganese oxides by SIMS, XPS and SEM Seyama H, Tani Y, Miyata N, Soma M, Iwahori K
1512 - 1515	Dependence of the precision of uranium isotope ratio on particle diameter in individual particle analysis with SIMS Esaka F, Watanabe K, Onodera T, Lee CG, Magara M, Sakurai S, Usuda S
1516 - 1518	Application of resonant laser postionization SNMS for quantitative depth profiling in stainless steel with oxide film Kubota N, Hayashi S
1519 - 1522	Teaching SIMS fundamentals using the FIB ion microscope Chater RJ, McPhail DS
1523 - 1526	TOF-SIMS study of red sealing-inks on paper and its forensic applications Lee J, Lee C, Lee K, Lee Y
1527 - 1530	ToF-SIMS characterization of fluoroalkyl derivatives of possible interest as water repellent for stone protection Torrisi A, Tuccitto N, Maccarrone G, Licciardello A
1531 - 1533	Using ToF-SIMS and EIS to evaluate green pretreatment reagent: Corrosion protection of aluminum alloy by silica/zirconium/cerium hybrid coating Chang CC, Wang CC, Wu CW, Liu SC, Mai FD
1534 - 1537	ToF-SIMS study of official seals from Han Dynasty Yin YS, Chen BJ, Ling YC
1538 - 1540	Characterization of environmental nanoparticles Fukuhara N, Suzuki K, Takeda K, Nihei Y
1541 - 1543	Using NanoSIMS to map trace elements in stainless steels from nuclear reactors Lozano-Perez S, Schroder M, Yamada T, Terachi T, English CA, Grovenor CRM
1544 - 1546	Analysis on nitrogen oxides by TOF-SIMS Hashimoto M, Watanabe E, Amano C, Haraki T, Nishi Y, Uchida HH
1547 - 1550	Impurity measurements in silicon with D-SIMS and atom probe tomography Ronsheim P, Flaitz P, Hatzistergos M, Molella C, Thompson K, Alvis R
1551 - 1554	Interlayer analysis of HfO2/SiO2/Si by SIMS and HRBS Sasakawa K, Fujikawa K, Toyoda T
1555 - 1559	Protein denaturation improves enzymatic digestion efficiency for direct tissue analysis using mass spectrometry Setou M, Hayasaka T, Shimma S, Sugiura Y, Matsumoto M
1560 - 1563	Topography and field effects in the quantitative analysis of conductive surfaces using ToF-SIMS Lee JLS, Gilmore IS, Fletcher IW, Seah MP
1564 - 1568	ToF-SIMS imaging of Cl at Cu grain boundaries in interconnects for microelectronics Barnes JP, Carreau V, Maitrejean S
1569 - 1571	Application of SIMS nano-analysis to the development of new metallurgical solutions Valle N, Drillet J, Perlade A, Migeon HN
1572 - 1575	Biological tissue imaging with a hybrid cluster SIMS quadrupole time-of-flight mass spectrometer Carado A, Kozole J, Passarelli M, Winograd N, Loboda A, Bunch J, Wingate J, Hankin J, Murphy R
1576 - 1579	ToF-SIMS imaging of PE/PP polymer using multivariate analysis Miyasaka T, Ikemoto T, Kohno T
1580 - 1583	Instrumental factors in resonance enhanced multi-photon ionization of FIB-sputtered atoms Sakamoto T, Kawasaki J, Koizumi M
1584 - 1587	Microscopy and chemical imaging of Behcet brain tissue Aranyosiova M, Michalka M, Kopani M, Rychly B, Jakubovsky J, Velic D
1588 - 1590	A fragment-free ionization technique for organic mass spectrometry with large Ar cluster ions Ninomiya S, Nakata Y, Honda Y, Ichiki K, Seki T, Aoki T, Matsuo J
1591 - 1594	Yield enhancement of molecular ions with MeV ion-induced electronic excitation Nakata Y, Honda Y, Ninomiya S, Seki T, Aoki T, Matsuo J
1595 - 1598	Characteristics of post-ionization using a femto-second laser Mibuka R, Hassaballa S, Uchino K, Yurimoto H, Todokoro R, Kumondai K, Ishihara M
1599 - 1602	Exploratory analysis of TOF-SIMS data from biological surfaces Vaidyanathan S, Fletcher JS, Henderson A, Lockyer NP, Vickerman JC
1603 - 1605	Extraction of inhomogeneous chemical species from TOF-SIMS images with topographic artifacts by using correlation coefficient mapping Iida S, Sanada N, Bryan SR, Suzuki M
1606 - 1609	A high brightness source for nano-probe secondary ion mass spectrometry Smith NS, Tesch PP, Martin NP, Kinion DE
1610 - 1613	Cluster SIMS with a hybrid quadrupole time-of-light mass spectrometer Carado A, Kozole J, Passarelli M, Winograd N, Loboda A, Wingate J
1614 - 1616	Evaluation of the dead time of the detector on SIMS Takano A
1617 - 1620	Development of a high lateral resolution TOF-SIMS apparatus for single particle analysis Sakamoto T, Koizumi M, Kawasaki J, Yamaguchi J
1621 - 1624	Local charge neutralization using secondary electrons induced by focused electron beam in TOF-SIMS analysis Sakamoto T, Yamaguchi J