C5 - C7 |
Electrochemical Properties of Intermetallic Phases and Common Impurity Elements in Magnesium Alloys Sudholz AD, Kirkland NT, Buchheit RG, Birbilis N |
G9 - G12 |
The Comparison of the High-k Sm2O3 and Sm2TiO5 Dielectrics Deposited on the Polycrystalline Silicon Kao CH, Chen HA, Lin SP |
J9 - J11 |
A High Performance Inkjet Printed Zinc Tin Oxide Transparent Thin-Film Transistor Manufactured at the Maximum Process Temperature of 300 degrees C and Its Stability Test Avis C, Jang J |
A11 - A13 |
Stabilization of Thin Film LiCoO2 Electrode by LiPON Coating Song J, Jacke S, Becker D, Hausbrand R, Jaegermann W |
A14 - A18 |
Numerical Simulation of the Effect of the Dissolution of LiMn2O4 Particles on Li-Ion Battery Performance Park J, Seo JH, Plett G, Lu W, Sastry AM |
A19 - A21 |
In Situ One-Step Synthesis of LiFePO4/Carbon-Fiber by a Self-Catalyzed Growth Route Yu HM, Teng XB, Xie JA, Cao GS, Zhao XB |
A22 - A23 |
Lithiated 1,4,5,8-Naphthalenetetraol Formaldehyde Polymer, An Organic Cathode Material Kassam A, Burnell DJ, Dahn JR |
B13 - B15 |
Fabrication of Low Reflectivity Poly-Crystalline Si Surfaces by Structure Transfer Method Fukushima T, Ohnaka A, Takahashi M, Kobayashi H |
B16 - B19 |
Electrochemical Characteristics of a Ni-GDC Nanoparticles-Structured-in-Nanowire as an Anode for LT-SOFCs Park HJ |
B20 - B22 |
Glass-Forming Exogenous Silicon Contamination in Solid Oxide Fuel Cell Cathodes Schuler JA, Wuillemin Z, Hessler-Wyser A, Van Herle J |
B23 - B25 |
CO Electro-oxidation by Rh Disulfo-deuteroporphyrin, and Its Mitigation Effect on CO Poisoning of PEMFC Anode Yamazaki S, Yao M, Takeda S, Siroma Z, Ioroi T, Yasuda K |
B26 - B29 |
Transmission Electron Microscopy Study on Microstructure and Interfacial Property of Thin Film Electrolyte SOFC Noh HS, Park JS, Lee H, Lee HW, Lee JH, Son JW |
B30 - B33 |
Start-Stop Phenomena in Channel and Land Areas of a Polymer Electrolyte Fuel Cell Schneider IA, von Dahlen S |
D17 - D19 |
Synthesis, Structural, and Optical Properties of Electrochemically Deposited GeO2 on Porous Silicon Jawad MJ, Hashim MR, Ali NK |
D20 - D22 |
Electrochemical Deposition of Zirconia Films on Diamond Electrodes Liu BX, Hu JP, Foord JS |
G13 - G16 |
Charge Trapping Memory Characteristics of p-Si/Ultrathin Al2O3O/(HfO2)(0.8)(Al2O3)(0.2)/Al2O3/Metal Multilayer Structure Tang ZJ, Xia YD, Xu HN, Yin JA, Liu ZG, Li AD, Liu XJ, Yan F, Ji XL |
H53 - H56 |
Enhanced Light Output of GaN-Based Vertical Light-Emitting Diodes with Superimposed Circular Protrusions and Hexagonal Cones Lee WC, Wang SJ, Uang KM, Chen TM, Kuo DM, Wang PR, Wang PH |
H57 - H59 |
Thin Film Transistor with Al-Ni-La Alloy Gate Metallization Technology Liu PT, Chou YT, Hsu TH, Fuh CS |
H60 - H62 |
In0.7Ga0.3As Channel n-MOSFET with Self-Aligned Ni-InGaAs Source and Drain Zhang XG, Guo HX, Gong XA, Zhou QA, Lin YR, Lin HY, Ko CH, Wann CH, Yeo YC |
H63 - H65 |
Effects of Interface Al2O3 Passivation Layer for High-k HfO2 on GaAs Suh DC, Cho YD, Ko DH, Lee Y, Chung KB, Cho MH |
H66 - H68 |
Enhanced Light Output of Vertical GaN-Based LEDs with Surface Roughened by SiO2 Nanotube Arrays Kuo DM, Wang SJ, Uang KM, Chen TM, Lee WC, Wang PR |
H69 - H72 |
Micro-Raman and Spreading Resistance Analysis on Beveled Implanted Germanium for Layer Transfer Applications Rainey P, Wasyluk J, Perova T, Hurley R, Mitchell N, McNeill D, Gamble H, Armstrong M |
H73 - H75 |
Control of Threshold Voltage and Suppressed Leakage Current on AlGaAs/InGaAs PHEMT by Liquid Phase Oxidation Lee KW, Lin HC, Lee FM, Chen WS, Wang YH |
H76 - H79 |
Performance Enhanced Carbon Nanotube Films by Mechanical Pressure for a Transparent Metal Oxide Thin Film Field Effect Transistor Jeon J, Lee TI, Choi JH, Kar JP, Choi WJ, Baik HK, Myoung JM |
H80 - H83 |
Flatband Voltage Characteristics of Hf-Incorporated Y2O3/Strained-Si Gate Stacks with Au, Pt, and Ni Metal Gates Mahata C, Das T, Mallik S, Hota MK, Varma S, Maiti CK |
H84 - H87 |
Improvement of Diffusion Barrier Performance of Ru Thin Film by Incorporating a WHfN Underlayer for Cu Metallization Yang CX, Ding SJ, Zhang DW, Wang PF, Qu XP, Liu R |
H88 - H92 |
Enhancement of a-IZO TTFT Performance by Using Y2O3/Al2O3 Bilayer Dielectrics Chen AH, Liang LY, Zhang HZ, Liu ZM, Ye XJ, Yu Z, Cao HT |
H93 - H95 |
Influence of Bias-Induced Copper Diffusion on the Resistive Switching Characteristics of a SiON Thin Film Yang PC, Chang TC, Chen SC, Lin YS, Huang HC, Gan DS |
H96 - H98 |
Effect of Trap Density on the Stability of SiInZnO Thin-Film Transistor under Temperature and Bias-Induced Stress Chong E, Chun YS, Lee SY |
H99 - H102 |
Phase Change Behavior in Ag10Ge15Te75 and the Electrolytic Resistive Switching in Both Amorphous and Crystalline Ag10Ge15Te75 Films Xu HN, Liu ZG, Xia YD, Chen LA, Zhu H, Guo HX, Yin JA |
K13 - K15 |
Epitaxial Graphene Growth on 3C-SiC(111)/AlN(0001)/Si(100) Hsia B, Ferralis N, Senesky DG, Pisano AP, Carraro C, Maboudian R |
H103 - H106 |
Carrier Transport and Multilevel Switching Mechanism for Chromium Oxide Resistive Random-Access Memory Chen SC, Chang TC, Chen SY, Li HW, Tsai YT, Chen CW, Sze SM, Yeh FS, Tai YH |